Acquisition of High Resolution Scanning Electron Microscope

9626366范德比尔特大学材料科学计划将获得一台高分辨率扫描电子显微镜，以支持材料科学研究和教育项目。该仪器是文理学院和工程学院首次共同致力于发展材料研究的基本基础设施。现有的扫描电子显微镜仪器是从1979年到1982年购买的，没有足够的分辨率来充分表征构成我们不断扩大的研究努力的各种类型的材料。新仪器的主要性能是在0.2~30千伏的可变加速电压，在30千伏时分辨率至少为2 nm，在L千伏时分辨率至少为5 nm。这组成像参数不能影响X射线能量色散光谱分析能力。此外，该系统将完全自动化，并将远程操作能力整合到范德比尔特计算机网络中。扫描电子显微镜(SEM)被公认为是分析所有类别材料的最广泛使用的材料表征工具之一。以纳米分辨率成像聚合物、陶瓷、金属和半导体的能力将影响范德比尔特材料研究的每个领域。高分辨率的扫描电子显微镜(HRSEM)也将极大地影响我们物理、化学和工程研究生的教育发展。***

9626366 Wittig The Materials Science Program at Vanderbilt University will acquire a high resolution scanning electron microscope (SEM) to support materials science research and education projects. This instrumentation represents the first joint commitment between the College of Arts and Science and the School of Engineering to develop the basic infrastructure for materials research. The existing SEM instrumentation, acquired from 1979 to 1982, has insufficient resolution to adequately characterize the diverse types of materials that comprise our expanding research efforts. A primary capability for a new instrument is variable accelerating voltage from 0.2 to 30 kV with resolution of at least 2 nm at 30 kV and 5 nm at l kV. This set of imaging parameters must not compromise the analytical capabilities for x-ray energy dispersive spectroscopy. In addition, the system will be fully automated with remote operation capabilities ald integrated into the Vanderbilt computer network. %%% A scanning electron microscope (SEM) is recognized as one of the most widely used materials characterization tools for analysis of all class of materials. The ability to image polymers, ceramics, metals, and semiconductors at nanometer resolution will impact every area of materials research at Vanderbilt. A high resolution SEM (HRSEM) will also strongly influence the educational development of our graduate students in Physics, Chemistry, and Engineering. ***