Imaging Microwave Frequency Currents in Operating Devices on Sub-Nanosecond Time Scales and Micron Length Scales

我们的目标是开发微波器件在微米长度尺度和亚rf周期时间尺度上成像微波频率磁场和电流的新方法。这些成像技术将为微波器件特性开辟一个新的微观认识。将特别关注超导微波器件，因为它们现在准备在移动电话和个人电脑市场上取得重大进展。除了可靠的低温冷却之外，这项新技术的关键限制是功率依赖和器件的非线性问题。我们的成像技术将特别侧重于理解和补偿这些设备中功率依赖和非线性的微观起源。采用的成像技术包括扫描微波显微镜、热法和非热法扫描局部能量沉积、扫描SQUID微波显微镜。＊＊＊

9632811 Anlarge Our objective is to develop new methods of imaging microwave frequency magnetic fields and currents on micron length scales and sub-rf-period time scales in microwave devices. These imaging techniques will open up a new microscopic understanding of microwave device properties. Special attention will be given to superconducting microwave devices as they are now poised to make significant inroads into the cellular telephone and PCS markets. The key limitations to this new technology, beside reliable cryogenic cooling, is the problem of power dependence and nonlinearity of the devices. Our imaging techniques will be specifically focused on the understanding and compensating for the microscopic origins of power dependence and nonlinearity in these devices. The imaging techniques to be employed include scanning microwave microscopy, bolometric and non-bolometric scanning local energy deposition, and scanning SQUID microwave microscopy. ***