Upgrade of Scanning Probe Microscopy Facility

这份来自化学研究仪器和设施项目（CRIF）的资助将帮助华盛顿州立大学化学系获得一台扫描探针显微镜（SPM）。该设备将加强许多领域的研究，包括自组装单层生长动力学的研究，蛋白质表面力的评估，通过精确施加应力在纳米尺度上控制材料的增强沉积的研究，分子电子材料的研究，以及沉积分子膜取向的确定。扫描探针显微镜（SPM）使研究人员能够直接对原子成像。该技术利用压电效应，将一根非常锋利的金属针插入到距离样品表面几埃的地方。这个距离足够小，电子可以漏出或穿过间隙，产生微小的电流。随着尖端与样品之间的间隙增大，电流减小。当探针穿过样品，在样品表面来回移动时，它会绘制出样品表面原子的等高线图。SPM用于控制用于制造半导体电路的材料。* * *

*** 9709273 WILLETT This award from the Chemistry Research Instrumentation and Facilities Program (CRIF) will assist the Department of Chemistry at Washington State University acquire a scanning probe microscope (SPM). This equipment will enhance research in a number of areas including the study of the kinetics of growth of self assembled monolayers, the evaluation of forces at protein surfaces, the study of the enhanced deposition of materials controlled on the nanoscale by precisely applied stress, studies of molecular electronic materials, and determination of the orientation of deposited molecular films. The scanning probe microscope (SPM) enables researchers to image atoms directly. The technique uses the piezoelectric effect which involves bringing an extremely sharp metal needle within a few angstroms of the sample surface. The distance is small enough for electrons to leak or tunnel across the gap and generate a minute current. As the gap between the tip and the sample increases, the current decreases. As then probe crosses the sample, moving back and forth across its surface, it traces out a contour map of the sample's surface atoms. The SPM is used in the control of material used to fabricate semiconductor circuits. ***