NEAR-FIELD THERMAL RADIATION FROM A HEATED ATOMIC FORCE MICROSCOPE CANTILEVER TIP

PI建议研究纳米级的辐射传输，特别关注扫描探针显微镜（SPM）悬臂梁尖端与其扫描表面之间的传热过程。 特别的考虑包括光子隧穿通过倏逝模和表面波，如等离子体或声子极化激元。 为了克服与控制高度局部化的加热源的温度相关的实验障碍，PI将利用原子力显微镜（AFM）的最新进展，其集成了加热器和具有纳米级锐度的尖端。 该项目的成功将首次测量两个物体之间的辐射能量交换，这两个物体被10 nm到1 nm的真空间隙隔开。 解决近场热输运中的复杂物理现象可能会导致纳米级器件、材料和工艺的发展，这些都严重依赖于热输运。 这项研究得到了化学和运输系统部门的热运输和热处理计划的支持。

The PI's propose to study radiative transport at the nanoscale, with particular focus on heat transfer processes between a scanning probe microscope (SPM) cantilever tip and the surface over which it scans. Special considerations include photon tunneling through evanescent modes and surfaces waves, such as plasmon or phonon polaritons. To overcome experimental obstacles associated with controlling the temperature of a highly localized heating source in controlled, close proximity to a temperature sensor, the PI's will utilize recent advances in atomic force microscope (AFM) cantilevers with integrated heaters and tips with nanometer-scale sharpness. Success in this project will offer the first measurement of radiative energy exchange between two objects separated by a vacuum gap from 10 nm down to 1 nm. Resolving complex physical phenomena in near-field thermal transport could lead to development of nanometer-scaled devices, materials, and process, which critically depend upon thermal transport. This research is being supported by the Thermal Transport and Thermal Processing Program of the Chemical and Transport Systems Division.