MRI: Acquisition of X-ray Photoelectron Spectroscopy System for Thin Films Research and Education

我们寻求获得X射线光电子（XPS）/俄歇电子能谱（AES）系统，用于增强表面和薄膜的化学表征。 具体来说，我们建议购买一台PHOIBOS 100半球形带电粒子分析仪（设计用于XPS、AES、UPS、SAM和ISS）以及来自SPECS的电子、X射线和紫外线源。PHOIBOS 100分析仪将使我们能够研究小至200 mm的区域，并进行角度分辨和空间分辨XPS和AES测量。 由于它有可能在多通道模式下工作（高达9），因此该单元具有非常好的能量分辨率，在XPS模式下对于Ag 3d 5/2和300 W Mg Ka在0.85 eV FWHM下为200 kcps，在UPS模式下（He激发）对于Ar 3 p 1/2的超高分辨率为4.4 meV。 PHOIBOS 100分析仪，结合扫描电子枪（型号EQ 22/35），X射线源（型号XR-50），紫外光源（型号UVS 10/35），和差动泵浦的小斑点离子枪（型号IQE 12/38）将大大扩展我们现有的分子束外延系统的能力，并将帮助我们解决理解化学，多层结构中的结构和动态磁性。特别是，我们将调查一系列的问题，需要非常仔细的化学状态（主要是磁性）元素在接口的特性。 例如，最近我们发现，在交换偏置系统（Fe/MnF_2和Fe/KNiF_3）的旋转各向异性表现出显着不同的强度沿着的易磁化轴和难磁化轴的Fe薄膜。 为了理解这种新效应的本质，我们需要研究界面处的Fe原子与反铁磁体（MnF 2或KNiF 3）之间的相互作用。 XPS技术对于此类研究是不可或缺的。另一个有趣的问题，我们想研究的是混合价态的Eu原子在表面的EuF 3薄膜和不同的Eu金属间化合物。 这一新仪器将大大扩展我们的研究和教学能力，使我们能够与学生一起解决有趣和重要的科学问题。购买表面和薄膜物理的电子光谱组件将大大加强我们的教学，基础研究以及我们部门与当地工业之间的互动。这种设备对学生的教育影响被整合在学生参与研究以及高级实验室课程等具体课程中。 我们的实验室为本科生和研究生（MS）提供了一个特殊的机会。学生培训。 通过获得薄膜合成和测量的实验室专业知识，在我们的研究小组培训的学生处于有利地位，在学术界和科罗拉多半导体和磁存储行业追求事业。 拟议的设备将补充我们现有的设施，使我们能够执行材料的化学表征沿着与现有的结构，磁性和电气表征能力。此外，我们将能够探索基础研究的令人兴奋的问题，例如了解多层结构中化学，结构和动态磁性之间的相关性。特别是，我们将调查一系列的问题，需要非常仔细的化学状态（主要是磁性）元素在接口的特性。 最后，这种新设备将使我们能够与当地的小型研发公司进行更多的合作，并帮助他们解决与表面物理相关的问题。

We seek to acquire an X-ray Photoelectron (XPS) / Auger Electron spectroscopy (AES) system for enhanced chemical characterization of surfaces and thin films. Specifically, we propose purchase of a PHOIBOS 100 hemispherical analyzer for charged particles (designed to work for XPS, AES, UPS, SAM, and ISS) and electron, X-ray, and UV sources from SPECS. The PHOIBOS 100 analyzer will allow us to study areas as small as 200 mm and carry out angle resolved and spatial resolved XPS and AES measurements. Since it has the possibility of working in multi channeltron mode (up to 9) this unit has very good energy resolution, 200 kcps @ 0.85 eV FWHM for Ag3d5/2 and 300 W Mg Ka in XPS mode and ultra high resolution of 4.4 meV on Ar 3p1/2 in UPS mode (He excitation). The PHOIBOS 100 analyzer, in combination with Scanning Electron gun (model EQ22/35), X-Ray Source (model XR-50), Ultraviolet Source (model UVS 10/35), and differentially pumped small-spot ion-gun (model IQE 12/38) will significantly expand our existing Molecular Beam Epitaxy system capability and will help us resolve important issues in understanding the correlations between chemical, structural and dynamic magnetic properties in multi-layered structures. In particular, we will investigate a series of problems which require very careful characterization of the chemical state of (mostly magnetic) elements at interfaces. For example, recently we have found that the rotational anisotropy in exchange bias systems (Fe/MnF2 and Fe/KNiF3) exhibit significantly different strength along the easy and hard axes of Fe ultrathin films. To understand the nature of this new effect we need to investigate the interaction between Fe atoms at the interface and antiferromagnets (MnF2 or KNiF3). The XPS technique is indispensable for such studies. Another interesting problem we would like to study is mixed valency of Eu atoms at the surface of the ultrathin EuF3 films and different Eu intermetallic compounds. This new instrumentation will significantly expand our research and teaching capabilities allowing us, together with students, to attack intriguing and important scientific problems.The purchase of electron spectroscopy components for surface and thin film physics will significantly strengthen our teaching, basic research, and interaction between our department and local industry. The educational impact of this equipment on students is integrated in student participation in research as well as in specific courses such as advanced laboratory classes. Our laboratory offers a special opportunity for both undergraduate and graduate (M.S.) student training. By gaining laboratory expertise in both synthesis and measurements of thin films, students trained in our research group are well positioned to pursue careers in academia and in the Colorado semiconductor and magnetic storage industries. The proposed equipment will complement our existing facilities by allowing us to perform chemical characterization of materials along with the existing structural, magnetic and electrical characterization capabilities. Furthermore, we will be able to explore exciting issues of basic research such as understanding the correlations between chemical, structural and dynamic magnetic properties in multi-layered structures. In particular, we will investigate a series of problems which require very careful characterization of the chemical state of (mostly magnetic) elements at interfaces. Finally, this new equipment will allow us to collaborate more with small local R&D companies and help them to solve problems related to surface physics.