Aberration-Corrected High-Resolution and in situ Transmission Electron Microscopy of Carbon Allotropes and Related Device Structures (Z02)

在这个中心项目中，与SFB的其他项目密切合作，将采用先进的FIB/SEM技术，结合像差校正的高分辨率和分析TEM技术，对碳同素异形体、碳同素异形体结构、杂化纳米复合材料和薄膜以及相关器件结构进行详细的原子尺度研究。此外，在第二个资助期开发的创新原位TEM/SEM技术将用于研究有机太阳能电池中晶体缺陷的形成和动力学以及（少层）石墨烯的表面功能化，以及混合纳米复合材料的结构演变。

Within this central project aberration-corrected high-resolution and analytical TEM in tandem with advanced FIB/SEM techniques will be employed for detailed atomic-scale investigations of carbon allotropes, carbon allotrope architectures, hybrid nanocomposites and thins films as well as related device structures, in close collaboration with the other projects of the SFB. Moreover, innovative in situ TEM/SEM techniques developed in the second funding period will be employed for studying the formation and dynamics of crystal defects and of surface functionalization of (few-layer) graphene, as well as the structural evolution of hybrid nano-composites in organic solar cells.