Modelling surface stresses in crystalline plates

本项目旨在提高我们对各向异性晶体板中表面应力对弯曲影响的认识。微/纳米机电系统作为传感器、开关、逻辑门、致动器和传感器，广泛应用于生物技术、医学、汽车、民用电子、航空电子和国防等领域。影响这些系统精度和可靠性的一个关键问题是如何正确预测系统中结构部件的尺寸相关表面应力。该项目旨在量化具有微/纳米厚度和任意晶体对称结构的表面应力变化与弯曲之间的关系。预期的项目成果可能会在克服当前设计微/纳米机电器件的缺点方面取得重大进展。

This project intends to improve our understanding of the influence of surface stress on bending in anisotropic crystalline plates. Micro/nanoelectro-mechanical systems as transducers, switches, logic gates, actuators and sensors are widely used in fields of biotechnology, medicine, automotive, civionics, avionics and defence. A key issue that affects the accuracy and reliability of these systems is how to correctly predict the size-dependent surface stress of the structural components in the systems. The project aims to quantify the relations between the change in surface stress and the bending of structures with micro/nanoscale thickness and arbitrary crystallographic symmetry. Expected project outcomes may lead to significant advancement in overcoming the current shortcomings in designing micro/nanoelectro-mechanical devices.