Characterization of Molecular Interaction in the Condensed Phase and at Interfaces by IR-Spectroscopy (C03)

N-杂多环的层和具有这种分子的功能层系统将通过IR光谱以非破坏性方式表征。在那里，典型的各向异性系统的复介电张量的定量测定是中心，以便从分子结构和排列，分子相互作用，电荷转移，极化红外激发，混合系统中的分离和降解的精确信息中获得。这些结果将提高对固体和界面分子行为的基本理解，从而有助于更好地控制和优化半导体性能。对于非均匀体系的表征，远场红外光谱将通过具有纳米分辨率的现代近场方法来完成。

Layers of N-heteropolycycles and functional layer systems with such molecules will be characterized by IR spectroscopy in a non-destructive manner. There, the quantitative determination of the complex dielectric tensor of the typically anisotropic systems is at the centre in order to obtained from that precise information on the molecular structure and arrangement, on molecular interactions, charge transfer, polaronic IR excitations, segregation in mixed systems, and degradation. The results will improve the basic understanding of the molecular behaviour in the solid and at interfaces and thus serve to better control and optimize the semiconductor properties. For the characterization of inhomogeneous systems, the far-field IR spectroscopy will be completed by a modern near-field method with a nanometer resolution.