Enabling high-resolution imaging and spectroscopy of electron beam sensitive hybrid material systems (A12)

在这项研究中，正在研究的无机/有机杂化体系(HIO)的非常特殊的光电性质在很大程度上由无机/有机界面的电子结构和电荷分布决定。透射式电子显微镜中的全息成像技术可以对静电势、电场和电荷分布进行成像。可用于该项目的最先进的电子能量损失谱为电子结构提供了亚纳米尺寸的探测器，能量分辨率约为5 MeV。基于这两个原则的新技术将被开发出来，以最大限度地减少电子束对样品的损害。然后，对束流敏感的HIO进行表征，以揭示可与理论进行比较的电荷密度和局部介电函数图。

The very special opto-electronic properties of hybrid inorganic/organic systems (HIOS) being investigated within this CRC are largely determined by the electronic structure and distribution of charges at the inorganic/organic interface. Holographic imaging techniques in transmission electron microscopy allow electrostatic potentials, electric fields, and charge distributions to be imaged. State of the art electron energy-loss spectroscopy available to this project provides a sub-nanometer-sized probe of the electronic structure with approximately 5 meV energy resolution. Novel techniques based on both of these principles will be developed to minimize the electron beam damage to the sample. Beam-sensitive HIOS will then be characterized to reveal maps of charge density and local dielectric function that can be compared to theory.