ERA NANOSCI: Characterization of electronic nanodevices by noise measurements

最近，人们发现，由电子器件产生的噪声包含有关于微观输运过程的有价值的信息，这是通过测量电流-电压特性而得不到的。虽然噪声频谱的测量现在在几个实验室都是标准的，但高阶噪声累积量的确定目前仍然是一个实验挑战。从理论上考虑，人们对获得这些量有相当大的兴趣。该提案将侧重于通过片上噪声检测器测量高阶噪声累积量的新策略。理论工作将分析由于探测器反馈、环境效应和虚假外部噪声等原因而可能导致的数据分析的复杂性，而实验工作将制造和使用芯片上噪声探测器来表征电子纳米结构。

Recently, it has been discovered that noise generated by electronic devices contains valuable information on microscopic transport processes not available from measurements of the current-voltage characteristics. While measurements of the noise spectrum are standard now at several laboratories, the determination of higher order noise cumulants is currently still an experimental challenge. From theoretical considerations there is considerable interest in getting access to these quantities. The proposal will focus and novel strategies to measure higher order noise cumulants by means of on-chip noise detectors. Theoretical work will analyse possible complications of the data analysis due to, e.g., detector feedback, environmental effects and spurious external noise, while experimental work will fabricate and employ onchip noise detectors for the characterization of electronic nanostructures.