High reslution and high intensity X-ray source

晶体的结构缺陷称为晶体的微结构，在衍射图上可以观察到弥散条纹。这种微观结构与晶体的热历史密切相关。然而，用普通的X射线源很难观察到显微组织引起的弥散条纹。如果在通常的实验条件下获得高分辨率、高强度的X射线源，这种X射线源可以广泛应用于科学和工业领域。实验中采用了普通的带细聚焦X射线管的X射线发生器，并设计了调整基座，使衍射系统的对准变得容易。通过引入Guinier-Johanson型单色器，将CuK1的严格单色化X射线聚焦在距单色器晶体210 mm处的胶片上，获得了高分辨率的X射线源。用Laue方法获得了较高的强度。Laue方法的缺点是高阶反射是相互重叠的。但是，如果使用严格单色化的X射线光源，胶片上只记录了一次反射，保留了高强度劳厄法的优点。将上述衍射系统应用于斜长石，发现其具有出溶的微结构，并以高分辨率观察到微区的弥散条纹。

The structural imperfection of a crystal, which is called to be a microstructure of a crystal, can be observed as diffuse streaks in the diffraction diagram. This microstructure is closely corelated to the thermal histories of the crystal. However, it is not easy to observe the diffuse streaks cause by microstructure by means of the usual X-ray source. If a X-ray source of high resolution and high intensity is attained in the usual experimental condition, this X-ray source can widely be applied to the scientific and industrial fields. The normal X-ray generator with a fine-focused X-ray tube was adopted to the present experiment and the adjustment base was also designed in order to make the alignment of the diffraction system easy. The high resolution X-ray source was obtained by introducing the Guinier-Johansonn type monochromator, by which the strictly monochromatized X-ray of CuK 1 , was focused on the film set by 210mm from the monochromator crystal. The high intensity was attained by means of Laue method. The weak point of Laue method is that the higher order reflections lie one upon another. However, if the strictly monochromatized X-ray source is used, only the first order reflection is recorded on the film and the merit of Laue method of high intensity can be kept on. The diffraction system above mentioned was applied to a plagioclase, which shows an exsolution microtexture, and the diffuse streaks by microdomains were clearly observed with high resolution.