Low-temperature heteroepitaxy of compound semiconductors on silicon substrate
Low-temperature heteroepitaxy of compound semiconductors on silicon substrate
批准号:
12555190
负责人:
OHYAMA Masanori
金额:
$7.17万
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (B)
财政年份:
2000
资助国家:
日本
项目状态:
已结题
起止时间:
2000 至 2002
中文摘要
在本研究中,我们开发了利用层状化合物半导体在硅衬底上垂直于c轴生长薄膜晶体的工艺技术,并对电子现象进行了研究。半导体薄膜的外延研究通常是基于考虑蒸发材料与衬底材料之间的晶体配位,而基于玻璃衬底的晶体生长技术是光学和电子器件应用所需要的。在硅衬底和熔融二氧化硅衬底上成功地生长出了在可见光区具有光学带隙的III-VI族化合物半导体晶体薄膜。讨论了层状化合物半导体的低温晶体生长机理和范德华外延的工艺条件。研究结果如下:1)提出了在硅衬底上制备层状化合物半导体(GaSe, GaS…More)的低温晶体生长工艺,并在电子束沉积法和射频溅射法的基础上开发了该工艺的基础技术。2)采用电子束沉积法在垂直于c轴的硅衬底上获得了GaSe薄膜。当衬底温度为500℃时,GaSe薄膜的光能隙为2.0eV,对其光导性能非常敏感。3)通过本文提出的激发膜-表面电荷法薄膜生长工艺,我们对石墨外延在硅衬底上的晶体生长机理有了较好的认识。4)利用电子(能量)阵雨辅助工艺,在衬底温度低于300℃的条件下,在硅衬底上获得了沿c轴方向的晶体气体薄膜。最后,在电子束沉积法传统工艺的基础上,提出的工艺使GaSe和GaS晶体薄膜能够在较大的衬底面积上沉积,并确定了GaSe和GaS晶体薄膜适用于光传感器器件和智能器件。少
英文摘要
In this research, we have developed the process technology of the thin film crystal-growth perpendicular to c-axis on the silicon substrate using the layered compound semiconductors and investigated electronic phenomena. The epitaxial research of semiconductor films is usual based on considering the crystalline coordination between evaporation material and substrate material, but the crystal-growth technology based on the glass substrate is need for optical and electronic device applications. The crystalline thin films of III-VI family compound semiconductor have an optical-band-gap in visible-light region are successfully grown on the silicon substrate and fused silica substrate. And we also discussed about the low-temperature crystal-growth mechanism and the process condition of van der waals epitaxy for the layered compound semiconductors. These results are as follows :1) The low-temperature crystal-growth process have been proposed for the layered compound semiconductors (GaSe, GaS … More ) on the silicon substrate, and the base technologies of our process are developed using the conventional semiconductor process of the electron beam deposition method and RF-sputtering method.2) It is established that the GaSe thin film on the silicon substrate perpendicular c-axis is obtained by electron beam deposition method. The GaSe film as the substrate temperature is 500℃ have an optical energy gap of 2.0eV, and these samples are indicated highly sensitive to the photo conductive property.3) From the proposed film-growth process using the exciting film-surface charge method we are obtained a good knowledge for the crystal growth mechanism of the grapho-epitaxy on the silicon substrate.4) From the electron (energy) shower-assist process, the crystalline GaS films along c-axis are obtained at substrate temperature lower than 300℃ based on the silicon substrate.Finally, these proposed processes based on the conventional process of the electron beam deposition method are enabling technology to deposit on the large substrate area, and it is established that the GaSe and GaS crystalline films are applicable to the photo sensor device and the intelligent device. Less
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Hiroshi Ito and Masanori Ohyama: "Thin film growth of layered semiconductor GaSe prepared by electron beam deposition method"Journal of the vacuum society of Japan. Vol.46, No.3. 314-317 (2003)
Hiroshi Ito和Masanori Ohyama:“电子束沉积法制备的层状半导体GaSe的薄膜生长”日本真空学会杂志。
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通讯作者:
小林勇介, 角倉大輔, 鈴木敬匡, タンコッスーン, 伊藤浩, 大山昌憲, 藤田安彦: "スパッタリング法で作成されたGaSe薄膜の暗電気伝導度測定"応用物理学会学術講演会 講演予稿集. 49. 593 (2002)
Yusuke Kobayashi、Daisuke Kadokura、Takamasa Suzuki、Tankosoon、Hiroshi Ito、Masanori Oyama、Yasuhiko Fujita:“溅射法制备的 GaSe 薄膜的暗电导率测量”日本应用物理学会学术会议论文集 49. 593。 (2002)
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大山昌憲, 伊藤浩: "電子ビーム蒸着法による層状化合物半導体GaS薄膜の膜構造と光学的性質"表面技術協会第107回講演大会要旨集. 107. 259-260 (2003)
Masanori Oyama、Hiroshi Ito:“电子束蒸发生产的层状化合物半导体 GaS 薄膜的薄膜结构和光学特性”表面技术协会第 107 届会议摘要 107. 259-260 (2003)。
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伊藤浩, 大山昌憲, 藤田安彦: "電子ビーム蒸着法によるGaSe化合物半導体薄膜の電子物性"応用物理学関係連合講演会 講演予稿集. 48. 639 (2001)
Hiroshi Ito、Masanori Oyama、Yasuhiko Fujita:“电子束蒸发产生的 GaSe 化合物半导体薄膜的电子特性”应用物理协会讲座论文集 48. 639 (2001)。
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伊藤浩, 大山昌憲, 藤田安彦: "電子ビーム蒸着法による層状化合物半導体GaSe薄膜の電気的特性の評価"応用物理学会学術講演会 講演予稿集. 62. 447 (2001)
Hiroshi Ito、Masanori Oyama、Yasuhiko Fujita:“通过电子束蒸发评估层状化合物半导体 GaSe 薄膜的电性能”日本应用物理学会学术会议论文集 62. 447 (2001)。
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共 31 条
Preparation of Crystalline Compound Semiconductor in Large Area on the Glass using Low Temperature Growth Technique
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批准号:09555113
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项目类别:Grant-in-Aid for Scientific Research (B)
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资助金额:$6.59万
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财政年份:1997
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负责人:OHYAMA Masanori
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依托单位:
Development of Photo-conductive Device with Electric Field Modulation Type using New Material of Layr Semiconductor
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批准号:07555114
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项目类别:Grant-in-Aid for Scientific Research (A)
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资助金额:$3.58万
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财政年份:1995
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负责人:OHYAMA Masanori
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依托单位: