200kV Transmission electron microscope

建议的具有强大电子源的透射电子显微镜允许不同的成像、衍射和分析方法，以实现高通量、高精度的微结构分析，这将有助于解决来自工程和自然科学的材料科学领域的广泛研究课题。特别是，它将促进对亮、暗和高角度环形暗场模式进行成像；用于结构和物相分析的电子衍射；内部磁场的测量(洛伦茨显微镜)；化学分析(通过能量色散X射线光谱分析)；断层扫描和现场研究，使用专用的现场样品架，用于在温度或气体压力升高的情况下进行研究。该仪器配置经过优化，可最大限度地灵活地进行层析成像和现场测量，这些测量需要极片区域中的更多空间。

The proposed transmission electron microscope (TEM) with a powerful electron source allows for different imaging, diffraction and analytical methods for a high-throughput, highly accurate microstructural analysis that will help to address a wide range of research topics in the area of materials science both from engineering and natural science. In particular, it will facilitate imaging bright, dark and high angle annular dark field mode; electron diffraction for structural and phase analysis; measurements of intrinsic magnetic fields (Lorentz microscopy); chemical analysis (by energy dispersive X-ray spectroscopy); tomography and in-situ studies using dedicated in-situ sample holders for investigations at increased temperatures or gas pressures. The instrument configuration is optimized for maximum flexibility for tomography and in-situ measurements that require more space in the pole piece area.