High Resolution Imaging and Analysis of Embedded Interfaces and Interface Phase Transitions in Interface-Dominated Nanomaterials

异质纳米结构材料和组件提供了独特的结构-性质关系，由它们所包含的内部界面主导。这一跨学科研究项目将结合基于高分辨率位相恢复X射线衍射和成像的新技术，与互补分析电子显微镜和原子探针分析相结合，协调研究战略性双晶体和纳米结构中嵌入界面的结构和性质。它有望为研究这种缺陷提供新的技术，并在理解嵌入式界面中发生的结构转变方面取得突破，这些转变是局部成分和温度变化的函数。

Heterogeneous nanostructured materials and assemblies offer unique structure-property relationships, dominated by the internal interfaces they contain. This interdisciplinary research project will combine novel techniques based on high-resolution phase-retrieval x-ray diffraction and imaging, with complementary analytical electron microscopy and atom probe analysis, in a coordinated study of the structure and properties of embedded interfaces in strategic bi-crystals and nanostructures. It promises new techniques for the study of such defects, and a breakthrough in the understanding of the structural transitions that occur in embedded interfaces as a function of local changes in composition and temperature.