single crystal diffractometer

要求获得一台X射线衍射仪，该衍射仪具有微焦点双源（铜和钼）、温度控制单元（在400 K和100 K之间无级调节）和最先进的检测器（短读出时间、足够大的检测器面积、大动态范围和两种辐射类型的高量子效率），用于单晶分析。衍射仪将用于分析固态化学和材料科学领域（无机化学系、物理化学系）以及分子化学所有领域（无机化学系、有机化学系、生物化学系、化学生物学系、分析化学系）的单晶化合物。这包括围绕以下主题的研究：i）具有和不具有重原子的化合物ii）绝对构型的测定iii）相变iv）温度敏感的化合物v）在测量条件下具有有限寿命的反应性物种vi）固有地显示晶体学无序问题的化合物vii）具有复杂的晶体孪生问题的化合物所要求的衍射仪将取代化学系现有的衍射仪，它将于2023年11月达到其计划寿命的终点（它于2008年投入运营）。此外，在相同的时间跨度内，将有可能进行大量的“标准单晶X射线分析”，在可接受的测量时间内，将有可能获得关于不含重原子的小单晶的可重复数据集。

The acquisition of an X-ray diffractometer with a microfocus dual source (copper and molybdenum), a temperature control unit (stepless between 400 K and 100 K), and a detector at the state of the art (short read-out time, sufficiently large detector area, large dynamic range, and high quantum efficiency for both types of radiation) for the analysis of single-crystals is requested. The diffractometer will be used for the analysis of single-crystalline compounds from the fields of solid state chemistry and materials science (departments of inorganic chemistry, physical chemistry) and from all fields of molecular chemistry (departments of inorganic chemistry, organic chemistry, biochemistry, chemical biology, analytical chemistry). This includes research centered around the following topics: i) compounds with and without heavy atoms ii) determination of the absolute configuration iii) phase transitions iv) temperature-sensitive compounds v) reactive species with restricted life-times under the conditions of the measurement vi) compounds that inherently show problems of crystallographic disorder vii) compounds with complex problems of crystallographic twinning The requested diffractometer will replace an existing diffractometer at the department of chemistry, which will reach the end of its planned lifetime in November 2023 (it was put in operation in 2008). Furthermore, a significantly larger number of "standard single-crystal X-ray analyses" will be possible in the same time span and publishable data sets on small single-crystals without heavy atoms will be possible with acceptable measurement times.