X-ray photoelectron spectrometer (XPS)

要求为X射线光电子能谱仪(XPS)提供资金，用于与材料研究有关的化学分析中的测量任务。以下主要要求很重要：(I)对空气敏感材料和复合材料以及经过化学修饰的表面进行化学结合状态的日常全自动分析，并进行横向扫描和高空间分辨率的表面分析。具有同步化学信息的成像是最重要的。(2)根据温度测量电池材料和电催化中界面和表面的反应变化，包括溅射的选择。(3)在现场电化学测量中测量化学状态的能力。(4)对材料进行深度分析，以分析埋藏层，并可能测量固体的状态密度(价带边)，此外还测量分子、表面缺陷和吸附物的能隙。

Funding for an X-ray photoelectron spectrometer (XPS) is requested for measurement tasks in chemical analysis related to materials research. The following main requirements are important: (i) Daily, fully automated analysis of chemical binding states of air-sensitive materials and composites, as well as chemically modified surfaces, with lateral scanning and high spatial resolution to perform surface analysis. Imaging with simultaneous chemical information is paramount. (ii) Temperature-dependent measurement of reactive changes of interfaces and surfaces in battery materials and electrocatalysis, including the option to sputter. (iii) Ability to measure chemical states in electrochemical measurements in-situ. (iv) Depth analysis of materials to analyze burying layers, and possible measurement of density of states (valence band edges) of solids, in addition to measurements of energy gaps of molecules, surface defects and adsorbates.