Surface Analysis from Backside of the Surface

在分析化学、自然科学或工程学中，研究表面都很重要。在表面分析中，表面被称为探测粒子的量子照射，并观察到从表面发出的结果信号。然而，由于表面处于难以接近的环境中，有时无法从表面探测到表面，在这种情况下，可以使用光声光谱、超声波或透射式X射线来探测表面。开发这样一种新的表面分析方法是本研究的目的。我们尝试了同步辐射源X射线吸收光谱、光声光谱和充放电现象来发展表面分析方法。我们得到了以下三个重要的结果：(1)电荷效应引起的X射线发射；(2)采用新机制的电子场致发射；(3)基于样品电流的表面和细粒子化学分析。

It is important in analytical chemistry, natural science, or engineering, to study surfaces. In the surface analysis, the surface is irradiated by quanta called probing particle, and the resulted signal emitted from the surface is observed. However, sometimes, the surface cannot probed from the surface, because of the surface is in a hard environment to approach.In such a case, photo-acoustic spectroscopy, supersonic, or transmitted x-rays are used to probe the surface. The development of such a new surface analysis method is the aim of the present research. We have tried synchrotron radiation source x-ray absorption spectroscopy, photo-acoustic spectroscopy, and charge-up and discharge phenomena to develop surface analysis methods. We have obtained the following three important results.(1) x-ray emission due to charge-up effect.(2) Field emission of electrons using a new mechanism.(3) Surface and fine particle chemical analysis using sample current.