Research on High Dependable Test for Crosstalk Faults in High Speed VLSIs

提出了一种超大规模集成电路(VLSI)中串扰故障的测试方法。串扰故障是由相邻两条线路之间的耦合作用引起的，传统故障模型的测试方法很难检测出串扰故障。分析了串扰故障的故障行为，定义了故障模型，提出了一种测试生成方法。此外，我们还改进了晶体管短路的方法，提高了故障诊断和测试码生成的效率。

In this research, a testing method for crosstalk faults in VLSI (Very Large Scaled Integrated Circuit) circuits has been proposed. A crosstalk fault is induced by coupling interaction between neighbor two lines, and it is hard to detect by the testing method for conventional fault models. We analyzed the fault behavior of crosstalk faults to define a fault model, and proposed a test generation method. Moreover we enhanced the method for transistor shorts to improve fault diagnosis and test pattern generation.