Fast 4D-STEM direct electron detection system

微观和纳米结构研究所(IMN)运营着纳米分析和电子显微镜中心(CENEM)的电子显微镜设施，这是一个中央用户设施，也是弗里德里希-亚历山大-纽伦堡大学(FAU)能力中心“先进材料工程”的一部分。CENEM为FAU的研究人员提供了用于先进材料表征的高分辨率和纳米分析技术。在扫描电子显微镜(STEM)领域，CENEM配备了两个具有分析能力的像差校正支架。CENEM为FAU的研究人员提供了用于先进材料表征的高分辨率和纳米分析技术。在IMN内部，于2022年8月成立了一个计算材料显微镜研究小组，主要研究四维STEM(4D-STEM)实现的计算显微镜技术。所需的仪器将使计算材料显微镜小组在1)尺度桥接、多模式原子分辨率层析成像、2)束敏感材料的原子分辨率相衬成像、3)用于实时处理4D-STEM数据流的方法开发和4)用于多模式4D-STEM实验自动化的方法开发领域中开展的研究主题得以实现。这四个研究主题需要一个最先进的快速成帧直接电子探测器，具有高动态范围、帧速率和剂量效率。为了实现主题1)、2)和4)中的目标，需要一个可定制的扫描发生器，其具有与直接电子探测器同步的定制点扫描和光束进动。配备先进扫描系统的新探测器将在FAU独一无二，不仅支持计算显微镜小组的研究主题，而且对IMN现有和计划中的项目也至关重要。除了为计算材料显微镜小组形成研究基础并在CENEM实现新的成像方法外，该仪器还将被广泛用于当前的几个倡议、新的RTG相关材料显微镜(RTG Related Material Microcope)合作研究项目。

The Institute of Micro- and Nanostructure Research (IMN) runs the electron microscopy facility of the Center for Nanoanalysis and Electron Microscopy (CENEM), a central user facility and part of the Competence Center "Engineering of Advanced Materials" of the Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU). CENEM provides FAU's researchers with high-resolution and nanoanalytical techniques for advanced materials characterization. In the area of Scanning Transmission Electron Microscopy (STEM), CENEM is equipped with two aberration-corrected STEMs with analytical capabilities. CENEM provides FAU's researchers with high-resolution and nanoanalytical techniques for advanced materials characterization. Within the IMN, a research group for Computational Materials Microscopy was established in August 2022, with a main research focus on computational microscopy techniques enabled by four-dimensional STEM (4D-STEM). The required instrumentation will enable the research themes pursued by the Computational Materials Microscopy Group in the areas of 1) scale-bridging, multi-modal atomic resolution tomography, 2) atomic resolution phase-contrast imaging of beam-sensitive materials, 3) method development for real-time processing of 4D-STEM data streams and 4) method development for automation of multi-modal 4D-STEM experiments. The four research themes require a state-of-the-art fast-framing direct electron detector with high dynamic range, frame rate, and dose efficiency. To achieve the goals in themes 1), 2), and 4), a customizable scan generator with custom point scanning and beam precession synchronized with the direct electron detector is required. The new detector with an advanced scan system will be unique at FAU and not only enable research themes within the Computational Microscopy Group but also be crucial to existing and planned projects within the IMN. Apart from forming the research foundation for the Computational Materials Microscopy group and enabling new imaging methods at CENEM, the instrumentation will be extensively used in several current initiatives, new RTG Correlative Materials Microscopy) collaborative research projects.