Understanding the relationship between structure and electric conduction of semiconducting Mg-doped C_<60> film

镁掺杂C_<60>是提高太阳能电池和薄膜晶体管等有机器件性能的有前途的材料。本文研究了掺镁C_<60>半导体薄膜的结构与导电性的关系。我们发现，mg掺杂的C_<60>中含有C_<60>-二聚体和聚合物，并且由于存在几种短长度C_<60>聚合物而导致晶体质量下降。电导率与Mg浓度和晶体质量有关。结果表明，采用mg掺杂C_<60>的有机器件，提高器件性能需要高的晶体质量。

Mg-doped C_<60> is promising material for improving performance of organic devices, such as solar cells and thin film transistors. In this study, we investigated the relationship between structure and electric conduction of semiconducting Mg-doped C_<60> film. We found that Mg-doped C_<60> contains C_<60>-dimers and polymers, and the crystal quality is degraded by the existence of several types of short length C_<60> polymers. Electrical conductivity is related both of Mg concentration and crystal quality. The results indicate that high crystal quality is necessary to improve organic device performance by using Mg-doped C_<60>.