Development of UV-photoelectron imaging system working in ambient air condition

研制了一种利用紫外光电子发射现象进行表面分析的新系统。物镜将紫外光聚焦在样品上，光电子在空气中被检测为电流。利用pc控制平台对样品表面各点的光电子发射进行测绘，得到了光电子产率图像。所提出的方法有望发展为一种在空气中相对于实际样品进行的简单表面分析方法。

New surface analysis system using ultraviolet photoelectron emission phenomenon was developed. Ultraviolet light was focused on the sample by the objective lens, and the photoelectron was detected as a current in the air. The photoelectron yield image was obtained by mapping the photoelectron emission from each point on the sample surface with a PC-controlled stage. The proposed method is expected to develop as a simple surface analysis method performed in the air with respect to real sample.