AFM data acquisition system and controller

通过这一应用，我们需要一种最先进的原子力显微镜控制器和数据采集系统。我们在研究有机分子在绝缘离子晶体表面的成核和生长方面处于国际领先地位。下一个关键步骤是对附着在金属电极上的分子进行3D力场成像，以研究作为系统原子结构函数的电荷转移和电子传输。为了实现这些目标，我们需要在更高的模式下操作AFM悬臂，从而在不牺牲灵敏度的情况下提高数据采集速度和分辨率。针尖-样品的相互作用表现为AFM悬臂梁的共振频率的移动(频率调制或NC-AFM技术)。一个主要的挑战是检测具有10-100 kHz带宽的MHz载波频率上的赫兹谐振频率漂移。这可以通过最近上市的商业数字数据采集和控制系统来实现。我们现在需要这个系统，以保持我们的领导地位。

With this application we request a state-of the art atomic force microscope controller and data acquisition system. We have achieved an international leadership position in investigating the nucleation and growth of organic molecules on insulating ionic crystal surfaces. A next crucial step is the 3D force field imaging of molecules attached to metal electrodes to investigate charge transfer as well as electronic transport as a function of the atomic structure of the system. To achieve these goals, we need to operate our AFM cantilevers at higher modes and thus frequencies to increase data acquisition speed and resolution without sacrificing sensitivity. Tip-sample interactions manifest themselves as a shift of the resonant frequency of the AFM cantilever (frequency modulation or nc-AFM technique). A major challenge is to detect Hz resonant frequency shifts on a MHz carrier frequency with a 10-100 kHz bandwidth. This can be done with a commercial digital data acquisition and control system that recently became available. We need this system now in order to maintain our leadership position.