Quantitative Analysis of the Microstructure of Materials with new techniques in the Electron Microscope

高文小组是世界上在电子显微镜中建立模型和提高对电子束与固体相互作用的理解以开发新的定量方法的领先小组之一。这项研究计划将使Gauvin小组在电子显微镜领域达到新的水平，使他们能够设计下一代电子显微镜，并开发新的计算机模拟方法，以高空间分辨率表征材料的微观结构。在电磁场中的电子轨迹的计算机模拟将被用来开发一种新的最佳电子显微镜，将在0.1 - 60千电子伏的范围内操作。本文提出了一种新的无标样电子显微镜X射线微区定量分析方法，用于测量真实的材料的Coster-Kronig转变因子。这将使一个新的三维纳米尺度的X射线数据分析的电子断层扫描的场发射透射电子显微镜（FE-TEM）的发展。将开发一个新的蒙特卡罗程序来模拟具有位错的块体材料中的电子沟道。这将有助于提高对位错结构对金属疲劳的认识。本文提出了一种提高扫描透射电子显微镜（STEM）极限分辨率的新方法--物理作图法.提出了一种利用STEM模式下的电子背散射衍射（EBSD）确定材料束缚结构的新方法。由于自1990年以来发表的与纳米技术有关的10万多篇科学论文使用了电子显微镜，因此电子显微镜的任何进步都将对科学技术产生重大影响。

The Gauvin group is one of the leading groups in the world in modeling and improving the understanding of electron beam interaction with solids for the development of new quantitative methods in the electron microscope. This research proposal is to put the Gauvin group to the next level in electron microscopy, allowing them to design the next generation of electron microscopes and also to develop new computer simulations methods to characterize the microstructure of materials at high spatial resolution. Computer simulations of electron trajectories in the electromagnetic field will be used to develop a new optimal electron microscope that will operate in the 0.1 - 60 keV range. A new standardless quantitative procedure for X-ray microanalysis in electron microscopy, for real materials, will be developed with the measurement of Coster-Kronig transition factors using a new method. This will allow the development of a new 3 dimensional nano scale analyses of x-ray date by electron tomography in the field emission transmission electron microscope (FE-TEM). A new Monte Carlo program to simulate electron channeling in bulk materials with dislocations will be developed. It will be applied to improve the understanding of dislocation structure on the fatigue of metals. The Pychographycal method will be implemented for improving ultimate resolution in scanning tramsmission electron microscope (STEM). A new method to determine the bound structure of materials with electron backscattered difraction (EBSD) in the STEM mode is proposed. Since more than 100 000 scientific papers that were published since 1990 that are related to nanotechnology used an electron microscope, it is clear that any advance in electron microscopy will have a significant impact in science and technology.