Exploring physical limits of electron beam characterization

随着纳米科学的日益重要和新型纳米材料的发展，电子显微镜的重要性日益增加。EM可以提供个位数纳米长度以下的定量信息。尖端的电磁为应用研究和开发带来了竞争优势，并获得了最新的电磁分析。NINT的EM研究项目专注于显微镜的开发，可以提供实用的、辐射敏感的样品的定量数据。为了提高我们的分析能力，我们进一步发展了物理基础电子能量损失谱（EELS）分析、电子全息和泽尼克相板成像、电子断层扫描、低温透射电镜和纳米束衍射。目前，许多工业和学术客户和合作者受益于NINT EM开发的专业知识。NINT EM不断吸引来自世界各地顶级实验室的合作，进一步加强了我们实验室的声誉。我们的大部分核心研究是由国家研究委员会/国家纳米技术研究所资助的。NSERC的支持主要用于保留nnt电子显微镜的博士生培训方面。学生将从事的项目包括电子散射和电子束对固体的损伤，电子全息和价损EELS的研究。

The importance of electron microscopy (EM) increases with the increasing importance of nanoscience and development of new nanomaterials. EM can provide quantitative information below single digit nanometer length scale. Cutting edge EM brings competitive advantage to application research and development with access to the newest EM analysis. The EM research program at NINT is focused on development of microscopy that can provide quantitative data on practical, radiation sensitive, samples. To improve our analytical capabilities, we further develop physics underlying electron energy loss spectroscopy (EELS) analysis, electron holography and Zernike phase plate imaging with electrons, electron tomography, cryo-TEM and nano-beam diffraction. Many industrial and academic clients and collaborators currently benefit from the expertize developed at NINT EM. NINT EM continuously attracts number of collaborations from top laboratories around the world further strengthening reputation of our laboratory. Most of our core research is funded by National Research Council / National Institute for Nanotechnology. The NSERC support serves primarily to retain the PhD student training aspect of the electron microscopy at NINT. The students will work on projects ranging from investigations of electron scattering and electron beam induced damage of solids to electron holography and valence loss EELS.