High-Precision non-Invasive Electromagnetic Scanner for Characterizing Circuits & Devices

随着5G/6G通信系统的出现，复杂的电磁结构(EMS)如相控阵、MIMO天线和可重构智能表面(RIS)不可避免地要提高数据速率和覆盖范围。在远场测量系统中，要确定大频率或低频率电磁散射的特性通常是困难和昂贵的。近场测量允许在较小的电波暗室中进行EMS测量。除了识别辐射源、射频(RF)元件的电流分布和天线的远场方向图外，近场数据还可用于分析电路性能和故障。我们阿尔伯塔大学现有的近场扫描仪无法接近被测设备(DUT)的表面，因为其金属部件会干扰电磁场。它的探头相对较大，带宽有限，空间分辨率较低(约100um)。这项提案寻求资金购买最先进的电光近场扫描仪(EONFS)。EONFS将利用目前200多万美元的NSERC和CFI资助的集成电路、RF/微波/毫米波和天线表征实验室，并支持30多个HQP。这是一个独特的系统，可以在超高采样分辨率(10um)和频率带宽(1 MHz-40 GHz)下同时进行无创幅度和相位测量。EONFS使探头可以放置在非常接近近场强度高的EMS表面。它可以在低频率下消除对大型电波暗室的需求。使用EONFS，我们的团队可以在基础和应用方面为三个核心项目做出重大贡献：1)EM表面和天线：为了支持新兴的5G/6G和物联网应用，我们打算开发RISS和小型化天线(通过测量近场源和映射等效源，我们将能够优化结构和计算远场辐射方向图)；2)集成电路：我们正在开发集成电路，以操作相控阵和芯片上的天线(使用非侵入式近场探测和晶片上表征可以准确检测分布式和高功率效应)；3)传感器和光-微波器件：我们打算开发用于传感和量子通信的超灵敏结构和集成光-微波器件(大测量动态范围、高空间分辨率和小型非金属探测器为验证我们新型传感器和光-微波器件的模型提供了理想的平台)。EONFS将使大量从事无线通信和传感应用的研究人员、工程师和学生受益，他们需要测量、表征和调整其设备。随着5G/6G技术继续快速发展，延迟获取该设备将限制我们计划中与技术相关的HQP培训，并将对我们吸引行业合作伙伴的能力产生不利影响。

As 5G/6G telecommunications systems emerge, complex Electro-Magnetic Structures (EMS) such as phased arrays, MIMO antennas, and reconfigurable intelligent surfaces (RIS) are inevitable to enhance data rate and coverage. It is often difficult and expensive to characterize large or low frequency EMSs in a far field measurement system. Near field measurements allow EMS measurements to be conducted in a smaller anechoic chamber. In addition to identifying the radiating sources, current distributions of radio frequency (RF) elements, and far field pattern of antennas, near-field data can be used to analyze circuit performance and failures. Our existing near-field scanner at the University of Alberta cannot get close to the surface of the device under test (DUT) because its metallic parts disturb the EM fields. It has relatively large probes, limited bandwidth, and coarse spatial resolution (around 100um). This proposal seeks funding to purchase a state-of-the-art Electro-Optic Near-Field Scanner (EONFS). An EONFS will leverage current $2+ million NSERC- and CFI-funded Integrated Circuits, RF/microwave/mm-wave, and antenna-characterization labs and support 30+ HQP. This is a unique system that allows simultaneous noninvasive amplitude and phase measurements at ultra-high sampling resolutions (10um) and frequency bandwidth (1MHz - 40GHz). The EONFS enables probes to be placed very close to the EMS surface, where near-field strength is high. It can eliminate the need for a large anechoic chamber at low frequencies. Using an EONFS, our teams can contribute significantly to three core programs in terms of fundamentals and applications: 1) EM Surfaces and antennas: In order to support emerging 5G/6G and Internet of Things applications, we intend to develop RISs and miniaturized antennas (by measuring near-field sources and mapping equivalent sources, we will be able to optimize the structure and calculate far-field radiation patterns); 2) Integrated Circuits: We are developing integrated circuits to operate phased arrays and antennas on chip (distributed and high-power effects can be detected accurately using nonintrusive near-field probing and on-wafer characterization); 3) Sensors and Optical-Microwave Devices: We intend to develop ultra-sensitive structures and integrated optical-microwave devices for sensing and quantum communication (the large measurement dynamic range, high spatial resolution, and small non-metal probes provide an ideal platform for verifying the model of our novel sensors and optical-microwave devices). An EONFS will benefit a large community of researchers, engineers, and students working on wireless communication and sensing applications who require measurement, characterization, and adjustment of their devices. As 5G/6G technologies continue to develop rapidly, delays in acquiring this equipment will constrain technologically relevant HQP training in our programs, and will adverse affect our ability to attract industrial partners.