Electron Beam Manipulation and Interaction Reconstruction for High-Resolution Electron Microscopy

电子显微镜提供各种材料的原子分辨率图像，并被广泛用于推动科学和技术的创新和理解，帮助解决社会面临的重大挑战。最常见的类型的电子显微镜扫描聚焦的电子束在样品上，并记录光束-样品相互作用的指标，以构建图像。然而令人惊讶的是，这些显微镜目前忽略或无法访问大量关于光束如何与样品相互作用的信息。为了解决这个问题，最近开发了新的显微镜检测器技术，其沿着光束成形和定时技术的进步，允许访问关于光束-样品相互作用的大大增加的信息。我是第一个成功使用这些新一代探测器之一，结合先进的相互作用重建算法和我开发的高速采集系统，产生前所未有的原子分辨率图像的加拿大研究人员。这个新系统中的技术和技术为电子显微镜提供了一个新的范例，我将在我的研究计划中推进。将取得的进展是需要提供这些新的分辨率水平和额外的信息，从生物和软材料，这是很容易被电子束损坏，随着沿着物理硬材料。这将通过研究和开发重建算法的改进，在空间和时间上对射束进行整形或操纵，以及探索导致电子束中样品退化的基本相互作用来进行。开发的新技术，以及在该计划中应用的材料的基本见解，将强烈影响生物材料，储能设备，医疗治疗和诊断材料以及先进计算设备的表征，开发和理解。此外，高素质的人员将在该计划中接受培训，他们将处于电子显微镜的最前沿，并具有跨科学，工程和技术领先行业的广泛技能，特别是在需要先进的数值数据分析和处理的地方。

Electron microscopes provide atomic resolution images of a vast range of materials and are used intensively to drive innovations and understanding in the sciences and technologies that help address major challenges faced by society. The most common type of electron microscope scans a focused electron beam over a sample and records indicators of the beam - sample interaction to construct images. Surprisingly though, these microscopes currently disregard or are unable to access vast amounts of information on how the beam interacts with the sample. To address this, new microscope detector technologies have recently been developed, which along with advances in beam shaping and timing techniques, permit access to vastly increased information upon the beam - sample interaction. I was the first Canadian researcher to successfully use one of these new generation detectors in combination with advanced interaction reconstruction algorithms and a high-speed acquisition system I developed, to produce unprecedented atomic resolution images. The techniques and technologies in this new system present a new paradigm for electron microscopy that I will advance in my research program. Advances will be made that are required to provide these new levels of resolution and additional information from biological and soft materials, which are easily damaged by the electron beam, along with physically hard materials. This will be performed through a combination of researching and developing improvements to the reconstruction algorithms, shaping or manipulating the beam both spatially and temporally, and exploring the fundamental interactions that lead to sample degradation in the electron beam. The developed new techniques, and the fundamental insights given to materials they are applied to in this program, will strongly impact the characterization, development and understanding of biological materials, energy storage devices, medical therapeutic and diagnostic materials, and advanced computing devices, for example. Furthermore, highly qualified personnel will be trained within this program who will be at the forefront of electron microscopy and have broad skills transferable across science, engineering and technology lead industries, particularly where there is a need for advanced numerical data analysis and processing.