Effects of Unintended Dopants on I-V Characteristics of the Double-Gate MOSFETs, a Simulation Study

Effects of Unintended Dopants on I-V Characteristics of the Double-Gate MOSFETs, a Simulation Study
复制标题

非预期掺杂剂对双栅极 MOSFET I-V 特性的影响仿真研究

DOI:
10.1088/0253-6102/58/1/24
复制
发表时间:
2012-07
影响因子:
3.1
通讯作者:
Tang Ting-Ao
Tang Ting-Ao
中科院分区:
物理与天体物理3区
文献类型:
--
作者:
Hu Guang-Xi;Wang Ling-Li;Liu Ran;Tang Ting-Ao

文献摘要

参考文献

相似文献

本文研究了沟道中非故意掺杂对双栅金属氧化物半导体场效应晶体管(MOSFET)伏安特性的影响。采用非平衡格林函数(NEGF)方法。提出了计算漏电流的量子输运模型,研究了亚阈值摆动和漏感生势垒降低(DIBL)效应。
In this paper, we study the effects of an unintended dopant in the channel on the current-voltage characteristics of a Double-Gate (DG) Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET). Non-Equilibrium Green's Function (NEGF) approach is used. A quantum transport model to calculate the drain current is presented and subthreshold swing and drain induced barrier lowering (DIBL) effect are studied.
DOI: 10.1143/jjap.46.1437
发表时间: 2007-04
影响因子: 1.5
作者:
Guangxi Hu;Ran Liu;T. Tang;S. Ding;Lingli Wang
通讯作者: Guangxi Hu;Ran Liu;T. Tang;S. Ding;Lingli Wang
DOI: 10.1109/ted.2003.816524
发表时间: 2003-09-01
影响因子: 3.1
作者:
Ren, ZB;Venugopal, R;Lundstrom, MS
通讯作者: Lundstrom, MS
DOI: 10.1088/0022-3727/42/10/105109
发表时间: 2009-05
期刊: Journal of Physics D: Applied Physics
影响因子: --
作者:
O. Kurniawan;P. Bai;E. Li
通讯作者: O. Kurniawan;P. Bai;E. Li
DOI: 10.1088/0253-6102/54/4/33
发表时间: 2010-10
影响因子: 3.1
作者:
Guang-Xi Hu;Lingli Wang;Liu Ran;Ting-Ao Tang;Zhi-Jun Qiu
通讯作者: Guang-Xi Hu;Lingli Wang;Liu Ran;Ting-Ao Tang;Zhi-Jun Qiu
DOI: 10.1109/ted.2008.2004647
发表时间: 2008-11
影响因子: 3.1
作者:
C. Alexander;G. Roy;A. Asenov
通讯作者: C. Alexander;G. Roy;A. Asenov