Characteristics of blocking voltage for power 4H-SiC BJTs with mesa edge termination
Characteristics of blocking voltage for power 4H-SiC BJTs with mesa edge termination
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具有台面边缘端接的功率 4H-SiC BJT 的阻断电压特性
DOI:
10.1088/1674-4926/31/7/074007
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发表时间:
2010-07
影响因子:
5.1
通讯作者:
Qian, Zhang
中科院分区:
文献类型:
--
作者:
Yimen, Zhang;Yuming, Zhang;Qian, Zhang
According to the avalanche ionization theory, a computer-based analysis is performed to analyze the struc- tural parameters of single- and multiple-zone junction termination extension (JTE) structures for 4H-SiC bipolar junc- tion transistors (BJTs) with
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影响因子:
3.1
作者:
Jianhui Zhang;Xueqing Li;P. Alexandrov;L. Fursin;Xiaohui Wang;J.H. Zhao
通讯作者:
Jianhui Zhang;Xueqing Li;P. Alexandrov;L. Fursin;Xiaohui Wang;J.H. Zhao
影响因子:
1.7
作者:
D. Sheridan;G. Niu;J. Merrett;J. Cressler;C. Ellis;C. Tin
通讯作者:
D. Sheridan;G. Niu;J. Merrett;J. Cressler;C. Ellis;C. Tin
影响因子:
5.1
作者:
Zhang, Qian;Zhang, Yuming;Zhang, Yimen
通讯作者:
Zhang, Yimen
影响因子:
1.9
作者:
A. Bhardwaj;K. Ranjan;Namrata;S. Chatterji;A. Srivastava;R. K. Shivpuri
通讯作者:
A. Bhardwaj;K. Ranjan;Namrata;S. Chatterji;A. Srivastava;R. K. Shivpuri
影响因子:
3.1
作者:
M. Tarplee;V. Madangarli;Q. Zhang;T. Sudarshan
通讯作者:
M. Tarplee;V. Madangarli;Q. Zhang;T. Sudarshan