Property manipulation through pulsed laser annealing in high dose Mg-implanted GaN

Property manipulation through pulsed laser annealing in high dose Mg-implanted GaN
复制标题

通过脉冲激光退火控制高剂量镁注入 GaN 的特性

DOI:
10.1063/5.0028760
复制
发表时间:
2020-12
影响因子:
3.2
通讯作者:
H. Lu
H. Lu
中科院分区:
物理与天体物理3区
文献类型:
--
作者:
Y.-T. Shi;F.-F. Ren;J. Hao;Z. Wang;J. Ye;W.-Z. Xu;D. Zhou;R. Zhang;Y. Zheng;H. Lu

文献摘要

参考文献

相似文献

在GaN基双极器件的大规模生产中,通过离子注入生成p型GaN是一个有吸引力的建议,然而去除注入引起的晶格扰动和缺陷是一项困难的工作,并且阻碍了GaN中电导率的转换。脉冲激光退火是一种有效的退火技术,可以恢复晶格结晶度,并使掺杂物保持注入轮廓。本文研究了脉冲激光退火对高剂量镁离子注入GaN的结构和光学恢复的影响。结构演化和振动动力学表明,在脉冲激光退火过程中,mg注入GaN具有明显的结构恢复和部分应变释放,阈值激光能量为400 mJ/cm2,而粗糙的表面结构是类似于液相外延的再生机制的结果。脉冲激光照射后,在3.35 eV下供体-受体跃迁增强,表明Mg从间隙位被有效激活,取代为Ga离子。这些结果表明,进一步优化激光退火技术具有很大的潜力来控制mg植入GaN的p型电导率,并在GaN双极器件中实现实际应用。
The generation of p-type GaN through ion implantation is an attractive proposition in the massive production of GaN-based bipolar devices, whereas the removal of implantation induced lattice disturbances and defects is a difficult exercise and hampers the conversion of conductivity in GaN. Pulsed laser annealing is an effective annealing technique to recover lattice crystallinity and activate dopants with the preserved implanted profile. In this work, the effect of pulsed laser annealing on structural and optical recovery in high-dose magnesium (Mg) ion-implanted GaN has been investigated. The structural evolution and vibrational dynamics indicate an obvious structural recovery and partial strain release of Mg-implanted GaN during the pulsed laser annealing process, with a threshold laser fluence of 400 mJ/cm2, while rough surface structures are a result of the regrowth mechanism similar to liquid phase epitaxy. The enhanced donor–acceptor transition at 3.35 eV after pulsed laser irradiation is a sign of the effective activation of Mg from interstitial sites into the substitution of Ga ions. These results suggest that further optimization of the laser annealing technique has promising potential to manipulate the p-type conductivity of Mg-implanted GaN and to be implemented in GaN bipolar devices for practical applications.
DOI: 10.1038/s41598-019-45177-0
发表时间: 2019-06
期刊: Scientific Reports
影响因子: 4.6
作者:
Shi Ya-Ting;Ren Fang-Fang;Xu Wei-Zong;Chen Xuanhu;Ye Ji;ong;Li Li;Zhou Dong;Zhang Rong;Zheng Youdou;Tan Hark Hoe;Jagadish Chennupati;Lu Hai
通讯作者: Lu Hai
DOI: 10.1063/1.5052493
发表时间: 2018-11
期刊: AIP Advances
影响因子: 1.6
作者:
M. Sumiya;K. Fukuda;H. Iwai;T. Yamaguchi;T. Onuma;T. Honda
通讯作者: M. Sumiya;K. Fukuda;H. Iwai;T. Yamaguchi;T. Onuma;T. Honda
DOI: 10.1063/1.2120893
发表时间: 2005-11
影响因子: 3.2
作者:
Han-Cong Wang;L. Tan;E. Chor
通讯作者: Han-Cong Wang;L. Tan;E. Chor
DOI: 10.1002/pssc.200461316
发表时间: 2005-05
期刊: Physica Status Solidi (c)
影响因子: --
作者:
S. Whelan;M. Kelly;Johnny Yan;G. Fortunato
通讯作者: S. Whelan;M. Kelly;Johnny Yan;G. Fortunato
DOI: 10.1149/1.2116187
发表时间: 2005-12
影响因子: --
作者:
M. Ha;Seung-Chul Lee;J. Her;K. Seo;M. Han
通讯作者: M. Ha;Seung-Chul Lee;J. Her;K. Seo;M. Han