Improved turn-on behavior in a diode-triggered silicon-controlled rectifier for high-speed electrostatic discharge protection

Improved turn-on behavior in a diode-triggered silicon-controlled rectifier for high-speed electrostatic discharge protection
复制标题

改进二极管触发可控硅整流器的开启行为,实现高速静电放电保护

DOI:
10.1007/s11432-017-9427-1
复制
发表时间:
2019-01
期刊:
Science China Information Sciences
影响因子:
--
通讯作者:
ong
ong
中科院分区:
其他
文献类型:
--
作者:
Zhang Lizhong;Wang Yuan;Wang Yize;Zhang Xing;He Y;ong

文献摘要

参考文献

相似文献

提出了一种用于静电放电(ESD)保护的传统二极管触发可控硅整流器(DTSCR)结构,并在65 nm CMOS工艺中得到证实。改进后的器件的特点是采用了按比例缩小的二极管串,利用可变比例因子缩短了其导通时间。为了确认修改后的DTSCR的寄生电阻调整,传输线脉冲(TLP)/非常快的传输线脉冲(VF-TLP)的测试和模拟上执行的设备。与传统的DTSCR相比,这种结构表现出改进的导通速度和鲁棒性,这适合于纳秒范围内的ESD事件的I/O保护,特别是充电器件模型(CDM)事件。
A conventional diode-triggered silicon-controlled rectifier (DTSCR) structure with a layout strategy for electrostatic discharge (ESD) protection is presented and confirmed in a 65-nm CMOS technology. The modified device is featured by a scaled-down trigger-diode string, which shortens its turn-on time using a variable scaling factor. To confirm the parasitic resistance adjustments of the modified DTSCR, transmission line pulsing (TLP)/very fast transmission line pulsing (VF-TLP) tests and simulations are performed on the device. Compared to a conventional DTSCR, this structure exhibits an improved turn-on speed and robustness, which are suitable for I/O protection of ESD events in the nanosecond range, particularly the charged-device model (CDM) event.
DOI: 10.1007/s11432-016-0301-3
发表时间: 2017-01
期刊: Science China Information Sciences
影响因子: --
作者:
Qian Zhou;Yan Han;Shifeng Zhang;Xiaoxia Han;Lu Jie;R. Cheung;Guangtao Feng
通讯作者: Qian Zhou;Yan Han;Shifeng Zhang;Xiaoxia Han;Lu Jie;R. Cheung;Guangtao Feng
DOI: --
发表时间: 2009-11
期刊: 2009 31st EOS/ESD Symposium
影响因子: --
作者:
R. Gauthier;M. Abou-Khalil;K. Chatty;S. Mitra;Junjun Li
通讯作者: R. Gauthier;M. Abou-Khalil;K. Chatty;S. Mitra;Junjun Li
自热效应对硅衬底纳米级 Ge p 沟道 FinFET 的影响
DOI: 10.1007/s11432-016-9106-x
发表时间: 2018
期刊: Science China Information Sciences
影响因子: --
作者:
Yin Longxiang;Shen Lei;Jiang Hai;Du Gang;Liu Xiaoyan
通讯作者: Liu Xiaoyan
DOI: 10.1109/tdmr.2011.2171487
发表时间: 2012-03-01
影响因子: 2
作者:
Chen, Wen-Yi;Rosenbaum, Elyse;Ker, Ming-Dou
通讯作者: Ker, Ming-Dou
DOI: 10.1007/s11432-016-0072-3
发表时间: 2016-08
期刊: Science China Information Sciences
影响因子: --
作者:
Jian Cao;Jingya Xu;Yuan Wang;Guangyi Lu;Xing Zhang
通讯作者: Jian Cao;Jingya Xu;Yuan Wang;Guangyi Lu;Xing Zhang