TGA: An Oracle-less and Topology-Guided Attack on Logic Locking
TGA: An Oracle-less and Topology-Guided Attack on Logic Locking
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TGA:针对逻辑锁定的无 Oracle 拓扑引导攻击
DOI:
10.1145/3338508.3359576
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发表时间:
2019
期刊:
影响因子:
--
通讯作者:
Guin, Ujjwal
中科院分区:
文献类型:
--
作者:
Zhang, Yuqiao;Cui, Pinchen;Zhou, Ziqi;Guin, Ujjwal
Due to the outsourcing of semiconductor design and manufacturing, a number of threats have emerged in recent years, and they are overproduction of integrated circuits (ICs), illegal sale of defective ICs, and piracy of intellectual properties (IPs). Logic locking is one method to enable trust in this complex IC design and manufacturing processes, where a design is obfuscated by inserting a lock to modify the underlying functionality so that an adversary cannot make a chip to function properly. A locked chip will only work properly once it is activated by programming with a secret key into its tamper-proof memory. Over the years, researchers have proposed different locking mechanisms primarily to prevent Boolean satisfiability (SAT)-based attacks, and successfully preserve the security of a locked design. However, an untrusted foundry, the adversary, can use many other effective means to find out the secret key. In this paper, we present a novel oracle-less and topology-guided attack denoted as TGA. The attack relies on identifying repeated functions for determining the value of a key bit. The proposed attack does not require any data from an unlocked chip, and eliminates the need for an oracle. The attack is based on self-referencing, i.e., it compares the internal netlist to find the key. The proposed graph search algorithm efficiently finds a duplicate function of the locked part of the circuit. Our proposed attack correctly estimate a key bit very efficiently, and it only takes few seconds to determine the key bit. We also present a solution to thwart TGA and make logic locking secure.
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DOI:
10.1145/2893183
发表时间:
2016
期刊:
ACM Trans. Design Autom. Electr. Syst.
影响因子:
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作者:
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DOI:
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2015
期刊:
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发表时间:
2014
期刊:
2014 IEEE 23rd North Atlantic Test Workshop
影响因子:
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DOI:
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发表时间:
2008
期刊:
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影响因子:
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通讯作者:
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DOI:
10.1109/vts.2017.7928946
发表时间:
2017
期刊:
2017 IEEE 35th VLSI Test Symposium (VTS)
影响因子:
--
作者:
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通讯作者:
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