Magnetic properties and characterization of CoCrM/TiCr/Si films produced by pulsed laser deposition

Magnetic properties and characterization of CoCrM/TiCr/Si films produced by pulsed laser deposition
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脉冲激光沉积 CoCrM/TiCr/Si 薄膜的磁性能和表征

DOI:
10.1016/j.jmmm.2007.11.020
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发表时间:
2008-04
影响因子:
2.7
通讯作者:
--
中科院分区:
材料科学3区
文献类型:
--
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采用脉冲激光沉积技术,在450~500℃温度范围内,在Si(111)衬底上制备了一系列CoCrM/TICR纳米颗粒薄膜,研究了薄膜的晶体结构和磁性。选区衍射和X射线衍射的电子显微镜图像表明,所制备的薄膜的结构与激光能量和沉积温度有关。结果表明,CoCrM/TICR薄膜的微观结构由细小的弥散晶组成,而随着CoCr合金层厚度的增加,薄膜的择优c轴取向随着CoCr薄膜中金属掺杂的增加而恶化。在Si衬底上形成的CoCrM/TICR薄膜的磁性能强烈依赖于磁层的厚度、颗粒结构和颗粒形状。激光沉积薄膜的矫直力和方形度的提高可能是由于磁晶各向异性能的提高和磁层厚度的减小。
A series of nanogranular CoCrM/TiCr thin films have been fabricated by pulsed-laser deposition on Si(111) substrates at 450–500°C. The crystal structure and magnetic properties of these films were investigated. The transmission electron microscope images with selected area diffraction and X-ray diffraction showed that the structure of as-prepared films is dependent on laser energy and deposition temperature. It was found that the microstructure of CoCrM/TiCr films consisted of fine dispersive crystal grains, while the preferential c-axis orientation of films deteriorated when the thickness of CoCr-alloy layer increased along with metal doping into the CoCr films. The magnetic properties of CoCrM/TiCr films formed on Si are strongly dependent on the thickness of magnetic layer, grain structure, and grain shape. Enhancement of coercivity and squareness of the laser-deposited film is probably due to the improvement in the magnetocrystalline anisotropy energy and the reduction in the thickness of magnetic layer.
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