A deficiency screen for zygotic loci required for establishment and patterning of the epidermis in Caenorhabditis elegans.
A deficiency screen for zygotic loci required for establishment and patterning of the epidermis in Caenorhabditis elegans.
复制标题
秀丽隐杆线虫表皮建立和图案化所需的合子位点的缺陷筛选。
DOI:
10.1093/genetics/146.1.185
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发表时间:
1997
期刊:
影响因子:
3.3
通讯作者:
Rothman,JH
中科院分区:
文献类型:
--
作者:
Terns,RM;Kroll-Conner,P;Zhu,J;Chung,S;Rothman,JH
To identify genomic regions required for establishment and patterning of the epidermis, we screened 58 deficiencies that collectively delete at least ∼67% of theCaenorhabditis elegansgenome. The epidermal pattern of deficiency homozygous embryos was analyzed by examining expression of a marker specific for one of the three major epidermal cell types, the seam cells. The organization of the epidermis and internal organs was also analyzed using a monoclonal antibody specific for epithelial adherens junctions. While seven deficiencies had no apparent effect on seam cell production, 21 were found to result in subnormal, and five in excess numbers of these cells. An additional 23 deficiencies blocked expression of the seam cell marker, in some cases without preventing cell proliferation. Two deficiencies result in multinucleate seam cells. Deficiencies were also identified that result in subnormal numbers of epidermal cells, hyperfusion of epidermal cells into a large syncytium, or aberrant epidermal differentiation. Finally, analysis of internal epithelia revealed deficiencies that cause defects in formation of internal organs, including circularization of the intestine and bifurcation of the pharynx lumen. This study reveals that many regions of theC. elegansgenome are required zygotically for patterning of the epidermis and other epithelia.
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影响因子:
2.6
作者:
R. Schnabel
通讯作者:
R. Schnabel
影响因子:
3.3
作者:
Maine,EM;Kimble,J
通讯作者:
Kimble,J
影响因子:
3.3
作者:
Ahnn,J;Fire,A
通讯作者:
Fire,A
影响因子:
4.6
作者:
M. Labouesse;S. Sookhareea;H. Horvitz
通讯作者:
M. Labouesse;S. Sookhareea;H. Horvitz
影响因子:
3.3
作者:
Denise V. Clark;T. Rogalski;Leo M. Donati;David L. Baillie
通讯作者:
David L. Baillie