Wettability in reactive Sn-base alloy/Ni-base metallic glass systems
Wettability in reactive Sn-base alloy/Ni-base metallic glass systems
复制标题
反应性锡基合金/镍基金属玻璃体系的润湿性
DOI:
10.1016/j.apsusc.2013.03.110
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发表时间:
2013-07
影响因子:
6.7
通讯作者:
Qi-Chuan Jiang
中科院分区:
文献类型:
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作者:
Lin-Yang Zhang;Ping Shen;Yan Qi;Qi-Chuan Jiang
Fluxless wetting of a Ni-base metallic glass alloy with a nominal composition of Ni–7Cr–3.2B–4.5Si–3Fe (wt.%) by several Sn-base solders was investigated using a dispensed sessile drop method in a high vacuum at 523K, and their interfacial microstructures were characterized. The results show that the wettability was in the sequence of Sn–51wt.% In>Sn–37wt.% Pb>Sn–57wt.% Bi>Sn–0.7wt.% Cu>Sn–3.0wt.% Ag–0.5wt.% Cu>pure Sn. The interface consisted of two distinct layers with the upper being the reaction layer and the lower the Sn-diffusion layer. For the Sn–0.7wt.% Cu, Sn–3.0wt.% Ag–0.5wt.% Cu and Sn–51wt.% In solders, the primary reaction products were (Cu,Ni)6Sn5, (Ni,Cu)3Sn4and Ni3(Sn,In)4, respectively, while for the other solders, they were Ni3Sn4. The thickness of the reaction layer in the central area varied in the order of Sn–51wt.% In>pure Sn>Sn–3.0wt.% Ag–0.5wt.% Cu≈Sn–0.7wt.% Cu>Sn–57wt.% Bi>Sn–37wt.% Pb, which is likely related to the concentration and diffusion rate of Sn. Moreover, the interfacial reaction facilitated the crystallization of the amorphous Ni-base substrates adjacent to the reaction layer and the crystallization in turn promoted the diffusion of Sn toward the substrate. The mechanisms for the different wettability of these solders with the Ni-base amorphous alloy were discussed, and finally suitable solders were recommended for the joining of this amorphous material
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影响因子:
1.2
作者:
H. Nishikawa;Krit WongPiromsarn;H. Abe;T. Takemoto;M. Fukuhara;A. Inoue
通讯作者:
H. Nishikawa;Krit WongPiromsarn;H. Abe;T. Takemoto;M. Fukuhara;A. Inoue
影响因子:
4
作者:
M. Rosenblum;F. Spaepen;D. Turnbull
通讯作者:
M. Rosenblum;F. Spaepen;D. Turnbull
影响因子:
2.6
作者:
Y. Y. Lee-Y.;H. Tseng;Y. Hsiao;C. Y. Liu
通讯作者:
Y. Y. Lee-Y.;H. Tseng;Y. Hsiao;C. Y. Liu
影响因子:
6.2
作者:
Hee-Yong Lee;Nam Hoon Goo;W. Jeong;K. Lee
通讯作者:
Hee-Yong Lee;Nam Hoon Goo;W. Jeong;K. Lee
DOI:
10.1109/96.618218
发表时间:
1997-08
期刊:
IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part B
影响因子:
--
作者:
Chun-Jen Chen;Kwang-Lung Lin
通讯作者:
Chun-Jen Chen;Kwang-Lung Lin