Promoted Hole Transport Capability by Improving Lateral Current Spreading for High-Efficiency Quantum Dot Light-Emitting Diodes.
Promoted Hole Transport Capability by Improving Lateral Current Spreading for High-Efficiency Quantum Dot Light-Emitting Diodes.
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通过改善高效量子点发光二极管的横向电流扩展来提高空穴传输能力
DOI:
10.1002/advs.202001760
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发表时间:
2020-12
期刊:
影响因子:
--
通讯作者:
Yang X
中科院分区:
文献类型:
--
作者:
Wu Q;Cao F;Wang H;Kou J;Zhang ZH;Yang X
Carrier imbalance resulting from stronger electron injection from ZnO into quantum‐dot (QD) emissive layer than hole injection is one critical issue that constrains the performance of QDs‐based light‐emitting diodes (QLEDs). This study reports highly efficient inverted QLEDs enabled by periodic insertion of MoO3 into (4,4′‐bis(N‐carbazolyl)‐1,1′‐biphenyl) (CBP) hole transport layer (HTL). The periodic ultrathin MoO3/CBP‐stacked HTL results in improved lateral current spreading for the QLEDs, which significantly relieves the crowding of holes and thus enhances hole transport capability across the CBP in QLEDs. Comprehensive analysis on the photoelectric properties of devices shows that the optimal thickness for MoO3 interlayer inserted in CBP is only ≈1 nm. The resulting devices with periodic two insertion layers of MoO3 into CBP exhibit better performance compared with the CBP‐only ones, such that the peak current efficiency is 88.7 cd A−1 corresponding to the external quantum efficiency of 20.6%. Furthermore, the resulting QLEDs show an operational lifetime almost 2.5 times longer compared to CBP‐only devices. This study reports over 20% external quantum efficiency quantum dot light‐emitting diodes with inverted structure that are based on periodic insertion of MoO3 into a (4,4’‐bis(N‐carbazolyl)‐1,1’‐biphenyl) (CBP) hole transport layer (HTL). The periodic MoO3/CBP‐stacked HTL results in improved current spreading, which significantly enhances hole transport capability across the CBP and thus facilitates charge injection balance in devices.
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