Comparison of three geometries for a cesium primary beam liquid secondary ion mass spectrometry source.
Comparison of three geometries for a cesium primary beam liquid secondary ion mass spectrometry source.
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铯主束液体二次离子质谱源的三种几何结构的比较。
DOI：
10.1021/ac00278a066
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发表时间：
1984
影响因子：
7.4
通讯作者：
Burlingame,AL
中科院分区：
文献类型：
--
作者：
Aberth,W;Burlingame,AL
本文比较了一种新型的直排浸没式透镜源和一种标准的90 °源的液体二次离子质谱（LSIMS）特性。所有来源都使用铯离子原束。使用维生素B12和Met-Lys-bradyklnln作为样品的结果表明，在线和浸没透镜源在降低的初级束强度下产生更强的母离子信号。同轴和90 °源谱的比较表明，初级离子动量可能是喷射次级离子接近初级离子方向的一个重要因素。Barber，Surman及其同事在次级离子质谱中引入液体靶（1，2）使得能够实际分析各种生物学重要样品的高质量分子（500-5000道尔顿）。该技术最初被称为快原子轰击（FAB），因为一个充满活力的初级中性束被用来溅射二次离子进行质量分析。它已被证明，使用初级离子束是同样有效的（3-6）。看来，液体性质的目标，而不是主束的电荷状态是该技术的重要特点。因此，我们使用术语液体二次离子质谱法（LSIMS）来描述从含有溶解在液体基质中的样品材料的靶溅射电离的技术。在LSIMS的典型源几何结构中，初级束具有与次级离子束的方向成90 °的固定方向，并且通过改变靶平面相对于初级束方向的角度来优化次级信号。最好的结果往往是在60（7）的入射角获得。可以认为，该大角度提高了二次离子效率，因为入射离子能量的更大部分沉积在靠近靶表面处，在靶表面处，入射离子能量可以更有效地用于二次离子喷射（8）。然而，这些离子束的互补引出角必须很小，并且对于入射离子束角和二次离子束角的最有效的独立组合存在不确定性。
The liquid secondary Ion mass spectrometry (LSIMS) characteristics of a new type of In-lineand an Immersion lens source are compared with a standard 90 geometry source where the primary beam Is normal to the extracted secondary Ion beam. All sources used a cesium Ion primary beam. Results using vitamin B12 and Met-Lys-bradyklnln as samples Indicated that both the In-line and immersion lens sources yielded a more Intense parent Ion signal at a reduced primary beam Intensity. A comparison of the In-line and 90 source spectra Indicates that the primary Ion momentum may be an important factor In ejecting secondary Ions close to the primary Ion direction.The introduction of a liquid target in secondary ion mass spectrometry by Barber, Surman, and co-workers (1, 2) has enabled the practical analysis of high-mass molecules (500-5000 daltons) of a wide variety of biologically important samples. The technique was initially termed fast atom bom-bardment (FAB) because an energetic primary neutral beam was used to sputter the secondary ions for mass analysis. It has since been demonstrated that the use of a primary ionic beam is equally effective (3-6). It appears that the liquid nature of the target rather than the charge state of the primary beam is the important feature of the technique. We therefore use the term liquid secondary ion mass spectrometry (LSIMS) to describe the technique of sputter ionization from a target containing sample material dissolved in a liquid matrix. In the typical source geometry of LSIMS, the primary beam has a fixed direction of 90 to that of the secondary ion beam, and the secondary signal is optimized by varying the angle of the target plane relative to the primary beam direction. Best results are often obtained at an incident angle of 60 (7). It can be argued that this large angle improves secondary ion efficiency because a greater portion of the incident ion energy is deposited close to the target surface where it can be more effectively utilized for secondary ion ejection (8). However, the complementary extraction angle for thesecondary ions must be small, and ambiguity exists as to what is the most effective independent combination of incident and secondary ion beamangles.
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影响因子：
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作者：
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影响因子：
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影响因子：
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影响因子：
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作者：
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DOI：
10.1016/0020-7381(83)85043-8
发表时间：
1983
期刊：
International Journal of Mass Spectrometry and Ion Physics
影响因子：
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作者：
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通讯作者：
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