Temperature stability of ultra-thin mixed BaSr-oxide layers and their transformation
Temperature stability of ultra-thin mixed BaSr-oxide layers and their transformation
复制标题
超薄混合BaSr氧化物层的温度稳定性及其转变
DOI:
10.1088/0957-4484/23/30/305202
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发表时间:
2012
期刊:
影响因子:
3.5
通讯作者:
K.R. Hofmann
中科院分区:
文献类型:
--
作者:
D. Müller-Sajak;S. Islam;H. Pfnür;K.R. Hofmann
In the context of investigations of physical, chemical and electrical properties of ultra-thin layers of epitaxial and monocrystalline Sr 0.3 Ba 0.7 O on Si (100), we also investigated their thermal stability with x-ray photoelectron spectroscopy (XPS), electron energy loss spectroscopy (EELS), and low energy electron diffraction (LEED). At temperatures above 400 C, transformation into silicate layers sets in. The stoichiometry after complete transformation was determined to be close to (Ba 0.8 Sr 0.2) 2 SiO 4 except for layers of only a few monolayers, where the silicate is not stoichiometric. There are strong indications that this silicate is stable until it desorbs at temperatures above 750 C. Crystallinity, as seen with LEED, is lost during this transformation. Although transformation into silicate is coupled with metal desorption and compactification of the layers, they seem to remain closed. In addition, traces of Ba silicide at the Si interface were detected after layer desorption. This silicide cannot be desorbed thermally. The silicate layer has a bandgap of 5.9±0.2 eV already for 3 ML thickness. Upon exposure to air, carbon and oxygen containing species, but no hydroxide, are formed irreversibly.
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DOI:
10.1116/1.1434968
发表时间:
2002
期刊:
Journal of Vacuum Science and Technology
影响因子:
--
作者:
D. Norton;C. Park;Y. Lee;J. Budai
通讯作者:
J. Budai
DOI:
10.1002/pssc.200982477
发表时间:
2010
期刊:
Physica Status Solidi (c)
影响因子:
--
作者:
D. Müller;A. Cosceev;C. Brand;K. Hofmann;H. Pfnür
通讯作者:
H. Pfnür
影响因子:
1.9
作者:
P. Weijs;J. Fuggle;P. Heide
通讯作者:
P. Heide
影响因子:
--
作者:
H. Schäfer;K. Janzon;A. Weiss
通讯作者:
A. Weiss
DOI:
10.1116/1.2966430
发表时间:
2008
期刊:
Journal of Vacuum Science and Technology
影响因子:
--
作者:
J. Liu;R. M. Martin;Jane P. Chang
通讯作者:
Jane P. Chang