Multichannel Online Lifetime Accelerating and Testing System for Power Light-Emitting Diodes
Multichannel Online Lifetime Accelerating and Testing System for Power Light-Emitting Diodes
复制标题
功率发光二极管多通道在线寿命加速及测试系统
DOI：
10.1109/jphot.2017.2692299
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发表时间：
2017-06
影响因子：
2.4
通讯作者：
Chen Zhong
中科院分区：
文献类型：
--
作者：
Xiao Jingjing;Guo Ziquan;Xiao Yao;Gao Yulin;Zhu Lihong;Lin Yue;Lu Yijun;Chen Zhong
加速寿命测试是实现发光二极管（LED）寿命预测和可靠性分析的常用工具。目前流行的加速方法，无论是离线还是在线，都采用体积大、能耗大的恒温室，这会导致内部仪器性能恶化，而且这些方法通常无法在线控制结温。在本文中，我们提出了一种多功能在线系统，通过集成到电流应力夹具的加热板直接控制散热器的温度。采用光谱仪+光复用器和电流源+电矩阵开关的组合，实现对LED的光学、电学、色度、热学等性能的全面实时测试。特别是采用脉冲电压法在线监测和控制结温，提高了寿命分析和预测的准确性和可靠性。采用新的文件格式HDF5来处理大量实验数据，有助于分析失效机理。
The accelerated life testing is a common tool to achieve lifetime prediction and reliability analysis for light-emitting diodes (LEDs). Currently, all popular accelerated methods, either offline or online, employ a large volume, energy-consuming temperature chamber, which will cause the instruments inside worse, and the methods are usually incapable of controlling the junction temperature online. In this paper, we propose a multifunctional online system that controls the temperature of heat sink directly by a heating plate integrated to electrical-current-stress fixture. The combinations of spectrometer with optical multiplexer and current source with electrical matrix switch are adopted to fulfill the comprehensive real-time testing of LEDs, including optical, electrical, colorimetric, and thermal properties. In particular, junction temperature is monitored and controlled online by pulse-voltage method, which raises the accuracy and reliability of lifetime analysis and prediction. A new file format–HDF5 is applied to process huge quantities of experimental data, which are helpful to analyze the failure mechanism.
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DOI：
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发表时间：
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期刊：
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影响因子：
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