Study on radiation chemistry of fluorinated polymers for EUV resist
Study on radiation chemistry of fluorinated polymers for EUV resist
复制标题
EUV抗蚀剂用氟化聚合物的辐射化学研究
DOI:
10.7567/jjap.54.06fe03
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发表时间:
2015
影响因子:
1.5
通讯作者:
K. Umegaki
中科院分区:
文献类型:
--
作者:
N. Nomura;K. Okamoto;Hiroki Yamamoto;T. Kozawa;R. Fujiyoshi;K. Umegaki
The fluorination of a chemically amplified resist is an effective method for use in EUV lithography. However, it has been suggested that the fluorination of the base polymer of the chemically amplified resist induces the electron scavenging reaction by the base polymer and reduces the acid yield. In this study, we clarified the formation of transient species and the acid yields of fluorinated polymers after exposure to the ionizing radiations. The acid yields of fluorinated polymers with hydroxyl groups were lower than that of poly(4-hydroxystyrene) (PHS). The lower acid generation efficiency in fluorinated polymers was due to not only the reaction between fluorinated polymers and electrons but also the lower deprotonation efficiency of the radical cation of the fluorinated polymer.
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DOI:
--
发表时间:
2014
期刊:
影响因子:
--
作者:
Naoya Nomura;Kazumasa Okamoto;Hiroki Yamamoto;Takahiro Kozawa;Ryoko Fujiyoshi;Kikuo Umegaki,
通讯作者:
Kikuo Umegaki,
DOI:
--
发表时间:
2007
期刊:
Jpn. J. Appl. Phys.
影响因子:
--
作者:
R. Hirose;T. Kozawa;S. Tagawa;T. Kai;T. Shimokawa
通讯作者:
T. Shimokawa
DOI:
--
发表时间:
2006
期刊:
Jpn. J. Appl. Phys.
影响因子:
--
作者:
A. Nakano;T. Kozawa;K. Okamoto;S. Tagawa;T. Kai;T. Shimokawa
通讯作者:
T. Shimokawa
DOI:
--
发表时间:
2008
期刊:
Jpn. J. Appl. Phys.
影响因子:
--
作者:
K. Natsuda;T. Kozawa;A. Saeki;S. Tagawa;T. Kai;T. Shimokawa
通讯作者:
T. Shimokawa
DOI:
--
发表时间:
2008
期刊:
影响因子:
--
作者:
K. Okamoto;M. Tanaka;T. Kozawa;S. Tagawa
通讯作者:
S. Tagawa