Study on radiation chemistry of fluorinated polymers for EUV resist

Study on radiation chemistry of fluorinated polymers for EUV resist
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EUV抗蚀剂用氟化聚合物的辐射化学研究

DOI:
10.7567/jjap.54.06fe03
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发表时间:
2015
影响因子:
1.5
通讯作者:
K. Umegaki
K. Umegaki
中科院分区:
物理与天体物理4区
文献类型:
--
作者:
N. Nomura;K. Okamoto;Hiroki Yamamoto;T. Kozawa;R. Fujiyoshi;K. Umegaki

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化学放大抗蚀剂的光刻是用于EUV光刻的有效方法。然而,已经提出化学放大型抗蚀剂的基础聚合物的交联诱导基础聚合物的电子清除反应并降低酸产率。在这项研究中,我们澄清了瞬态物种的形成和氟化聚合物暴露于电离辐射后的酸产量。含羟基氟聚合物的酸产率低于聚4-羟基苯乙烯(PHS)。氟化聚合物中较低的酸生成效率不仅是由于氟化聚合物与电子之间的反应,而且还由于氟化聚合物的自由基阳离子的较低的去质子化效率。
The fluorination of a chemically amplified resist is an effective method for use in EUV lithography. However, it has been suggested that the fluorination of the base polymer of the chemically amplified resist induces the electron scavenging reaction by the base polymer and reduces the acid yield. In this study, we clarified the formation of transient species and the acid yields of fluorinated polymers after exposure to the ionizing radiations. The acid yields of fluorinated polymers with hydroxyl groups were lower than that of poly(4-hydroxystyrene) (PHS). The lower acid generation efficiency in fluorinated polymers was due to not only the reaction between fluorinated polymers and electrons but also the lower deprotonation efficiency of the radical cation of the fluorinated polymer.
用于极紫外光抗蚀剂的氟化聚合物的辐射化学
DOI: --
发表时间: 2014
期刊:
影响因子: --
作者:
Naoya Nomura;Kazumasa Okamoto;Hiroki Yamamoto;Takahiro Kozawa;Ryoko Fujiyoshi;Kikuo Umegaki,
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抗蚀剂模型化合物的自由基阳离子动力学
DOI: --
发表时间: 2008
期刊:
影响因子: --
作者:
K. Okamoto;M. Tanaka;T. Kozawa;S. Tagawa
通讯作者: S. Tagawa