Laser-induced front side etching of fused silica with XeF excimer laser using thin metal layers
Laser-induced front side etching of fused silica with XeF excimer laser using thin metal layers
复制标题
使用 XeF 准分子激光器使用薄金属层对熔融石英进行激光诱导正面蚀刻
DOI:
10.1016/j.apsusc.2011.10.145
复制
发表时间:
2012
影响因子:
6.7
通讯作者:
K. Zimmer
中科院分区:
文献类型:
--
作者:
P. Lorenz;M. Ehrhardt;A. Wehrmann;K. Zimmer
Laser-induced front side etching (LIFE) is a method for laser etching of transparent materials using thin absorber layers, e.g., for precision engineering or even optical applications. Aluminium, chromium, molybdenum, silver as well as titanium with various layer thicknesses (5–100nm) were applied as absorber for etching trenches in fused silica with nanosecond XeF excimer laser radiation. The sample surfaces were processed at laser fluences up to 10J/cm2and laser pulse numbers from 1 to 10 pulses. A linear growth of the etching depth at rising laser fluence was found. The film thickness dependency is more complex and mostly influenced by the optical properties of the thin metal films. The influence of the laser fluence, the number of pulses, the absorber material as well as the absorber layer thickness on the etching process, the etching depth, and the surface modification were presented and discussed. A simple model is given that allows the discussion of the etching depth in dependency on the laser fluence and the metal film thickness. The measurements represented a good agreement with the calculated results by a thermal model. The LIFE method allows nm-precision etching of fused silica with etching depths up to 150nm.
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影响因子:
1.1
作者:
K. Zimmer;R. Böhme;B. Rauschenbach
通讯作者:
B. Rauschenbach
DOI:
--
发表时间:
2003
期刊:
影响因子:
--
作者:
K. Zimmer
通讯作者:
K. Zimmer
DOI:
10.1007/s00339-006-3847-y
发表时间:
2007
期刊:
Applied Physics A
影响因子:
--
作者:
B. Hopp;T. Smausz;M. Bereznai
通讯作者:
M. Bereznai
DOI:
--
发表时间:
2009
期刊:
影响因子:
--
作者:
K. Zimmer;R. Böhme;C. Vass;B. Hopp
通讯作者:
B. Hopp
影响因子:
6.7
作者:
J. Krüger;W. Kautek
通讯作者:
W. Kautek