Target implantation and redeposition processes during high-power impulse magnetron sputtering of aluminum

Target implantation and redeposition processes during high-power impulse magnetron sputtering of aluminum
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高功率脉冲磁控溅射铝靶材注入和再沉积过程

DOI:
10.1088/0022-3727/46/8/084009
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发表时间:
2013
期刊:
Journal of Physics D: Applied Physics
影响因子:
--
通讯作者:
Winter J
Winter J
中科院分区:
--
文献类型:
--
作者:
Will A;De los Arcos T;Corbella C;Hecimovic A;Machura PD;Winter J

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用X射线光电子能谱研究了不同等离子体条件下铝靶在高功率脉冲磁控溅射过程中,靶对Ar的滞留和靶材料的再沉积过程。不同放电条件下的Ar径向浓度分布有显著差异。在赛道区域内,以Ar离子通量为主的注入被辐射增强的扩散损失项补偿。在赛道外,离子注入的作用减弱,靶对Ar的保留可能源于再沉积Al的吸气和离子诱导的Ar解吸之间的平衡。
The processes of argon retention by the target and redeposition of target material were investigated by x-ray photoelectron spectroscopy as a function of radial position for different plasma conditions in high-power impulse magnetron sputtering of aluminum targets. Significant differences in Ar radial concentration profiles were observed for different discharge conditions. Inside the racetrack area, Ar ion flux-dominated implantation is compensated by radiation-enhanced diffusion loss terms. Outside the racetrack, the role of ion implantation is diminished, and Ar retention by the target may stem from a balance between gettering by redeposited Al and ion-induced Ar desorption.
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