An FPGA-based system for generalised electron devices testing.
An FPGA-based system for generalised electron devices testing.
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DOI：
10.1038/s41598-022-18100-3
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发表时间：
2022-08-17
影响因子：
4.6
通讯作者：
Prodromakis, Themis
中科院分区：
文献类型：
--
作者：
Foster, Patrick;Huang, Jinqi;Serb, Alex;Stathopoulos, Spyros;Papavassiliou, Christos;Prodromakis, Themis
随着我们的世界数字化，电子系统变得越来越普遍。与此同时，即使是基本的组件也在经历一波改进，新的晶体管，忆阻器，电压/电流基准，数据转换器等，每年都由全球数百个研发团队设计。到目前为止，测试所有这些设计的主力一直是一套实验室仪器，包括示波器和信号发生器，提到最流行的。然而，随着组件变得越来越复杂，引脚数量激增，对更多并行和通用测试工具的需求也变得更加迫切。在这项工作中，我们描述和基准的FPGA系统开发，解决这一需求。该通用测试系统具有64通道源表单元和用于数字I/O的32个数字引脚。我们证明，这个台式系统可以获得电流噪声本底，脉冲输送和最大电流驱动/通道。然后，我们展示了该仪器的使用，在执行三个特性的测量任务的选择：（a）二极管和晶体管的电流-电压特性，（B）完全并行读出忆阻器交叉阵列和（c）DAC的积分非线性测试。这项工作介绍了一个缩小规模的电子实验室封装在一个单一的仪器，提供了一个转向更负担得起的，可靠的，紧凑的和多功能的仪器，新兴的电子技术。
Electronic systems are becoming more and more ubiquitous as our world digitises. Simultaneously, even basic components are experiencing a wave of improvements with new transistors, memristors, voltage/current references, data converters, etc, being designed every year by hundreds of R &D groups world-wide. To date, the workhorse for testing all these designs has been a suite of lab instruments including oscilloscopes and signal generators, to mention the most popular. However, as components become more complex and pin numbers soar, the need for more parallel and versatile testing tools also becomes more pressing. In this work, we describe and benchmark an FPGA system developed that addresses this need. This general purpose testing system features a 64-channel source-meter unit, and banks of 32 digital pins for digital I/O. We demonstrate that this bench-top system can obtain current noise floor, pulse delivery at and maximum current drive/channel. We then showcase the instrument’s use in performing a selection of three characteristic measurement tasks: (a) current–voltage characterisation of a diode and a transistor, (b) fully parallel read-out of a memristor crossbar array and (c) an integral non-linearity test on a DAC. This work introduces a down-scaled electronics laboratory packaged in a single instrument which provides a shift towards more affordable, reliable, compact and multi-functional instrumentation for emerging electronic technologies.
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DOI：
10.1109/tim.2009.2031850
发表时间：
2010-08-01
影响因子：
5.6
作者：
Chang, Weng-Yew;See, Kye-Yak;Hu, Bo
通讯作者：
Hu, Bo
影响因子：
3.1
作者：
Chen, An
通讯作者：
Chen, An
影响因子：
64.8
作者：
Strukov, Dmitri B.;Snider, Gregory S.;Williams, R. Stanley
通讯作者：
Williams, R. Stanley
影响因子：
3.1
作者：
Berdan, Radu;Serb, Alexander;Prodromakis, Themis
通讯作者：
Prodromakis, Themis
影响因子：
41.2
作者：
Linn, Eike;Rosezin, Roland;Waser, Rainer
通讯作者：
Waser, Rainer