Modulation of the photoluminescence of Si quantum dots by means of CO2 laser pre-annealing

Modulation of the photoluminescence of Si quantum dots by means of CO2 laser pre-annealing
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CO2 激光预退火调制 Si 量子点的光致发光

DOI:
10.1016/j.apsusc.2010.03.080
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发表时间:
2010-06
期刊:
Applied Surface Science (IF: 1.795)
影响因子:
--
通讯作者:
Rong-ling Xiong
Rong-ling Xiong
中科院分区:
其他
文献类型:
--
作者:
Yong-bin Chen;Yong Ren;You-yuan Zhao;Ming Lu陆明;Rong-ling Xiong

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嵌入SiO2中的Si量子点(QD)通常可以通过在惰性气体气氛中在1100℃下对SiOx(x<2)薄膜进行热退火来制备。在这项工作中,SiOx薄膜首先以逐点扫描模式受到CO2激光的快速照射,这一过程称为预退火,然后照常在1100℃下热退火1小时。经过这种预退火处理后,Si QD 的光致发光(PL)强度得到了增强。这种PL增强并不是由于激光为相分离提供的额外热预算,而是归因于通过激光照射在SiOx内产生了额外的Si点成核位点,这有利于在随后的热退火过程中形成额外的Si QD。
Si quantum dots (QDs) embedded in SiO2can be normally prepared by thermal annealing of SiOx(x<2) thin film at 1100°C in an inert gas atmosphere. In this work, the SiOxthin film was firstly subjected to a rapid irradiation of CO2laser in a dot by dot scanning mode, a process termed as pre-annealing, and then thermally annealed at 1100°C for 1h as usual. The photoluminescence (PL) intensity of Si QD was found to be enhanced after such pre-annealing treatment. This PL enhancement is not due to the additional thermal budget offered by laser for phase separation, but attributed to the production of extra nucleation sites for Si dots within SiOxby laser irradiation, which facilitates the formation of extra Si QDs during the subsequent thermal annealing.
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发表时间: 2000-11
期刊: Nature
影响因子: 64.8
作者:
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