Engineering Research Equipment Grant: Supporting Equipment for Scanning Tip Microscopy

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A scanning tip microscopy laboratory has been established at the Optical Sciences Center, University of Arizona, which aims to characterize isolated semiconductor clusters used for nonlinear optics interactions. The characterization facility is a crucial link between fabrication and application groups working in the field of lightwave technology, because it makes possible tailoring the fabricated media to the applications requirements. The laboratory capabilities include scanning tunneling microscopy (STM), scanning force microscopy (SFM), and near-field scanning optical microscopy (NSOM). Acquisition of several pieces of equipment would enhance these capabilities. 1. General purpose: a spectrum analyzer is needed to monitor the acoustical and mechanical noise that exists during the interaction of the tip and sample. A single spectrum analyzer will serve six different ongoing experimental efforts. 2. UHV-STM: a Knudsen source is needed for semiconductor fabrication, a magnetic rotary drive to transport samples, and a LEED and Auger for surface analysis. 3. Sputtering gun and power supply. 4. Molecular Modeling Computer.