Structure and Surface Interactions of Condensed Fullerene Materials

扫描隧道显微镜（STM）和原子力显微镜（AFM）被用于直接成像分离的富勒烯分子，并获得其局部状态密度的映射。利用表面显微工具研究了富勒烯的结构和电子性质。富勒烯-金属、富勒烯-半导体和富勒烯-分子在缩合膜中的相互作用正在进行研究。将C-60分子包埋在甲基异丁基酮薄膜中，制备复合富勒烯材料。后者揭示了明显的分子间对比，其起源正在本项目中进行调查。最后，尖端样品的相互作用所涉及的显微镜技术正在研究的目的是提高这些技术的效用。这个项目涉及到用表面显微镜对最近发现的一组技术上很重要的富勒烯分子进行表征。由这些分子组成的材料最近表现出了固态物理学家、材料科学家和化学家感兴趣的戏剧性特性。提出的研究将提供有关这些材料的结构和电子特性的信息。这一信息具有根本意义，应为这些材料的实际应用铺平道路。

Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are being used to directly image isolated fullerene molecules and obtain a mapping of their local density of states. The structure and electronic properties of the fullerenes are being studied by the surface microscopy tools. Fullerene-metal, fullerene-semiconductor, and fullerene-molecule interactions in condensed films are under study. Preparation of composite fullerene materials will be carried out using C-60 molecules embedded in methyl isobutyl ketone films. The latter have revealed pronounced intermolecular contrast, the origins of which are being investigated in this project. Finally, the tip-sample interactions involved in the microscopy technique is being investigated with the objective of improving the utility of these techniques. %%% This project concerns the characterization, by surface microscopy, of a technologically important group of the recently discovered fullerene molecules. Materials composed of these molecules have recently demonstrated dramatic properties of interest to solid state physicists as well as materials scientists and chemists. The proposed research will provide information about the structure and electronic properties of these materials. This information is of fundamental interest and should pave the way toward practical application of these materials.