Materials and Semiconductor Devices Evaluation System for Undergraduate Microelectronics Laboratory
Materials and Semiconductor Devices Evaluation System for Undergraduate Microelectronics Laboratory
批准号:
9051870
负责人:
Muhammad Khaliq
金额:
$1.18万
依托单位国家:
美国
项目类别:
Standard Grant
财政年份:
1990
资助国家:
美国
项目状态:
已结题
起止时间:
1990-07-01 至 1992-12-31
中文摘要
材料表征和半导体器件参数测量是本科微电子实验室的重要组成部分。本项目通过增加半导体参数分析仪,增强了实验室的分析设备。该系统使学生能够表征材料的电子特性,也可以测试和测量他们制造的器件参数。本单元用于电气工程专业的五门本科课程。该奖金将由首席研究员所在机构提供等额的奖金。
英文摘要
Characterization of materials and measurement of semiconductor device parameters are an important part of undergraduate microelectronics laboratory. This project enhances the analytic facilities of the laboratory through the addition of a semiconductor parameter analyzer. This system enables the students to characterize the electronic properties of the materials, and also to test and measure their fabricated devices parameters. The unit is used in five undergraduate courses in Electrical Engineering. The award is being matched by an equal amount from the principal investigator's institution.
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