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Presidential Young Investigators Award: Modification of Protein Structure Near Charged Surfaces

Presidential Young Investigators Award: Modification of Protein Structure Near Charged Surfaces
总统青年研究员奖:带电表面附近蛋白质结构的修饰
批准号:
9057119
负责人:
Karen Gleason
金额:
$31.25万
依托单位国家:
美国
项目类别:
Continuing Grant
财政年份:
1990
资助国家:
美国
项目状态:
已结题
起止时间:
1990-07-01 至 1996-12-31

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中文摘要
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英文摘要
The focus of this PYI research is on achieving a fundamental understanding of thin films and Interfacial Transport by utilization of state-of-the-art NMR techniques. Several diverse areas of focus are: Hydrogen in SiO2 Thin Films and at Si/SiO2 Interfaces - The use of 100 A thick films and lower growth temperatures in integrated circuit manufacture leads to increased hydrogen incorporation. In SiO2 films, hydrogen is proposed to pasivate electrical defects, modify oxidation kinetics, and alter film properties. Crystalline Diamond Thin Films - Improved understanding of diamond nucleation and growth is needed in order to deposit single crystalline films over large areas, as desired for semiconductor applications. Photoresist Thin Films - Efforts to optimize and control microlithographic processes are influenced by the density variations and motion in polymeric photoresist films. Proteins Near Charge Interfaces - Transport across biological membranes and several bioseparation and biocatalysis techniques involve proteins near charged interfaces. Changes in tertiary protein structure induced by thorough preferential interaction with charged and polar protein segments can be observed directly with NMR. Reversed micelles, having few chemical components and large surface areas, provide a relatively simple system for initial study. A fundamental understanding of thin films and interfaces is a crucial components of process optimization in the microelectronics and biotechnology industries. Unique and valuable information is elucidated through the application of selected nuclear magnetic resonance (NMR) techniques to study the atomic scale structure of thin films and interfaces. This knowledge can be used to develop and test atomistic models of film growth and interfacial chemistry, with the ultimate goal of tailoring chemical processes for desired application.
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Engineering Research Equipment: Solid-State NMR Spectrometer Upgrade for Polymers
Nuclear Magnetic Resonance of Porous Silicon Surfaces
Chemistry of Diamond Nucleation and Growth: Kinetic Measurement, Modeling, and Film Characterization via REMP/MSand Solid State NMR
Hydrogen in Silicon Dioxide Thin Films Studied by Nuclear Magnetic Resonance
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