Test Algorithms for Physical Neighborhood Pattern Sensitive Faults in Reconfigurable RAMS

这项研究解决了测试大型、可重构随机存取存储器的故障，这些故障是由于存储器单元的物理邻域中产生的某些模式造成的。这些是模式敏感故障（PSF）。目前的方法不处理5和9细胞邻域，而且很复杂。在本研究中，提出了邻域模式敏感故障检测位的充分必要条件。基于这些结果，正在设计测试随机存取存储器（ram）中5和9单元物理邻域psf的算法。这些算法处理以下情况：逻辑和物理地址空间不相同、内存需要重新配置，以及使用内置的错误检测和纠正技术。正在探索将这些算法用于内置自检实现。

Saluja This research addresses testing large, reconfigurable random access memories for faults due to certain patterns originating in the physical neighborhood of a memory cell. These are pattern sensitive faults (PSF). Current methods do not deal with 5 and 9 cell neighborhoods, and are complex. In this research, necessary and sufficient conditions to test check bits for neighborhood pattern sensitive faults are being developed. Based on these results, algorithms to test for 5 and 9 cell physical neighborhood PSFs in random access memories (RAMs) are being designed. These algorithms deal with the cases where logical and physical address spaces are not identical, memories are reconfigured, and where built in error detection and correction techniques are employed. The use of these algorithms for built in self test implementation is being explored.