Acquisition of an Instrument for Scanning Probe Microscopy

这种扫描探针显微镜将具有隧穿和 扫描力头，将用于纳米尺度 包括固体、破碎的 材料、固体-流体和固体-固体界面。 的目标 它将用于的研究项目是测量 纳米尺度上的结构和电子性质。 这个项目是华盛顿州研究工作的一部分 大学材料研究中心，专注于 材料的微观结构和微观化学性质。 来自化学、物理和化学系的研究人员， 机械和材料工程部门将利用 这个工具。 初步实验包括（a）测定 金属氮化物，碳化物， 通过离子束增强技术生长的铁电氧化物， 通过激光烧蚀;（B）观察断裂和变形 感应特征和结构，特别是在绝缘 材料，在原子尺度上--包括位错 接口的安排和结构;（c）研究 固体表面的激光烧蚀;以及（d）测定 异质表面结构的电子性质 扫描隧道光谱学

This scanning probe microscope will have both tunneling and scanning force heads and will be used for nanometer scale characterization of materials including solids, fractured materials, solid-fluid and solid-solid interfaces. The goal of the research projects for which it will be used is to measure both structure and electronic properties on the nanometer scale. This project is part of a research effort in the Washington State University Center for Materials Research which is focusing on the microstructural and microchemical properties of materials. Researchers from the departments of chemistry, physics, and mechanical and materials engineering departments will make use of this instrument. Initial experiments include (a) determination of nanostructure of thin films of metal nitrides, carbides, ferroelectric oxides, grown by ion beam enhanced techniques and by laser ablation; (b) observation of fracture and deformation induced features and structures, particularly in insulating materials, on an atomic scale -- including dislocation arrangements and the structure of interfaces; (c) studies of laser ablation of solid surfaces; and (d) determination of electronic properties of heterogeneous surface structures using scanning tunneling spectroscopy.