Acquisition of an Instrument for Scanning Probe Microscopy

这种扫描探针显微镜将具有隧道和扫描力头，并将用于纳米尺度的材料表征，包括固体，断裂材料，固体-流体和固体-固体界面。该研究项目的目标是在纳米尺度上测量其结构和电子特性。该项目是华盛顿州立大学材料研究中心研究工作的一部分，该中心专注于材料的微观结构和微化学性质。化学系、物理系、机械与材料工程系的研究人员将使用该仪器。初始实验包括(a)测定离子束增强技术和激光烧蚀法生长的金属氮化物、碳化物、铁电氧化物薄膜的纳米结构；(b)在原子尺度上观察断裂和变形引起的特征和结构，特别是在绝缘材料中——包括位错排列和界面结构；(c)固体表面激光烧蚀的研究；(d)利用扫描隧道光谱法测定非均质表面结构的电子性质。

This scanning probe microscope will have both tunneling and scanning force heads and will be used for nanometer scale characterization of materials including solids, fractured materials, solid-fluid and solid-solid interfaces. The goal of the research projects for which it will be used is to measure both structure and electronic properties on the nanometer scale. This project is part of a research effort in the Washington State University Center for Materials Research which is focusing on the microstructural and microchemical properties of materials. Researchers from the departments of chemistry, physics, and mechanical and materials engineering departments will make use of this instrument. Initial experiments include (a) determination of nanostructure of thin films of metal nitrides, carbides, ferroelectric oxides, grown by ion beam enhanced techniques and by laser ablation; (b) observation of fracture and deformation induced features and structures, particularly in insulating materials, on an atomic scale -- including dislocation arrangements and the structure of interfaces; (c) studies of laser ablation of solid surfaces; and (d) determination of electronic properties of heterogeneous surface structures using scanning tunneling spectroscopy.