Acquisition of an Instrument for Scanning Probe Microscopy

这种扫描探针显微镜将同时具有隧道力头和扫描力头，并将用于材料的纳米级表征，包括固体、断裂材料、固体-流体和固体-固体界面。它将用于研究项目的目标是在纳米尺度上测量结构和电子性质。该项目是华盛顿州立大学材料研究中心的一项研究工作的一部分，该中心专注于材料的微观结构和微化学特性。来自化学系、物理系、机械和材料工程系的研究人员将使用这种仪器。初步实验包括：(A)确定用离子束增强技术和激光烧蚀方法生长的金属氮化物、碳化物、铁电氧化物薄膜的纳米结构；(B)在原子尺度上观察断裂和变形引起的特征和结构，特别是绝缘材料的特征和结构--包括位错排列和界面结构；(C)激光烧蚀固体表面的研究；和(D)利用扫描隧道光谱测定非均质表面结构的电子性质。

This scanning probe microscope will have both tunneling and scanning force heads and will be used for nanometer scale characterization of materials including solids, fractured materials, solid-fluid and solid-solid interfaces. The goal of the research projects for which it will be used is to measure both structure and electronic properties on the nanometer scale. This project is part of a research effort in the Washington State University Center for Materials Research which is focusing on the microstructural and microchemical properties of materials. Researchers from the departments of chemistry, physics, and mechanical and materials engineering departments will make use of this instrument. Initial experiments include (a) determination of nanostructure of thin films of metal nitrides, carbides, ferroelectric oxides, grown by ion beam enhanced techniques and by laser ablation; (b) observation of fracture and deformation induced features and structures, particularly in insulating materials, on an atomic scale -- including dislocation arrangements and the structure of interfaces; (c) studies of laser ablation of solid surfaces; and (d) determination of electronic properties of heterogeneous surface structures using scanning tunneling spectroscopy.