Development of an HREELS Analysis System for the Study of Polymers, Semiconductors, and Metal-Oxides

点击翻译按钮获取中文摘要

This project is for the development of a surface analysis system equipped with latest generation high resolution electron energy loss (HREEL) spectrometer. This instrument is capable of an increased signal of at least 20 times for a fixed energy resolution and 5 times better energy resolution compared to other available spectrometers. These improvements will allow HREELS to be applied to the characterization of the vibrational properties of the surfaces and interfaces of a variety of technologically important materials, including, polymers, semiconductors, and metal oxides, at a new level of detail. The projects for which the spectrometer will initially be used include the molecular characterization of polymer surfaces and interfaces, semiconductor surface and interface dynamics, and reactivity of metal oxide surfaces.